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Highly mobile oxygen hole-type charge carriers in fused silica

Published online by Cambridge University Press:  31 January 2011

Friedemann Freund ,
Michael M. Masuda  and
Minoru M. Freund
Friedemann Freund
Affiliation:
Department of Physics, San Jose State University, San Jose, California 95192
Michael M. Masuda
Affiliation:
Department of Physics, San Jose State University, San Jose, California 95192
Minoru M. Freund
Affiliation:
Department of Physics, San Jose State University, San Jose, California 95192
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Abstract

Some peculiar positive charge carriers are thermally generated in fused silica above 500 °C. These charge carriers appear to be positive holes, chemically O− states, probably arising from dissociation of peroxy defects. The charge carriers give rise to a pronounced positive surface charge which disappears upon cooling but can be quenched by rapid quenching from ≍800 °C. Reheating to ≍200 °C remobilizes these charge carriers and causes them to anneal below 400 °C. The generation of positive holes charge carriers may be important to understand failure mechanisms of SiO2 insulators.

Type
Materials Communications
Information
Journal of Materials Research , Volume 6 , Issue 8 , August 1991 , pp. 1619 - 1622
Copyright
Copyright © Materials Research Society 1991

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