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Direct Imaging of Atomic Rearrangements on Extended Gold Surfaces

Published online by Cambridge University Press:  25 February 2011

David J. Smith
Affiliation:
Department of Metallurgy and Materials Science, University of Cambridge, Free School Lane, Cambridge, CB2 3RQ, England.
L. D. Marks
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ 85287.
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Abstract

Rearrangements of atomic columns on extended gold surfaces have been imaged directly using a 500kV high resolution electron microscope. The (100), (110) and (111) surface profiles were all found to be highly mobile and microscopically rough, with (111) in particular developing a characteristic hill-and-valley morphology. The presence of surface steps had a marked influence on the direction of surface diffusion only for the (100) surface. The observations establish that high-resolution profile imaging can provide unique information about surface self-diffusion which is unobtainable by other techniques.

Type
Research Article
Copyright
Copyright © Materials Research Society 1985

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References

[1] Smith, D.J., Helvetica Physica Acta. 56, 463 (1983).Google Scholar
[2] Marks, L.D., Surface Science, 139, 281 (1984).10.1016/0039-6028(84)90022-0CrossRefGoogle Scholar
[3] Marks, L.D. & Smith, D.J., Nature, 303, 316 (1983).10.1038/303316a0Google Scholar
[4] Marks, L.D., Phys. Rev. Letts. 51, 1000 (1983).10.1103/PhysRevLett.51.1000Google Scholar
[5] Smith, D.J. & Marks, L.D., in Proc. 7th Int. Conf. HVEM (Berkeley, 1983), Eds. Fisher, R.M., Westmacott, K. & Gronsky, R., pp. 5358.Google Scholar
[6] Marks, L.D. & Smith, D.J., Surface Sci. 143, 495 (1984).10.1016/0039-6028(84)90555-7CrossRefGoogle Scholar
[7] Smith, D.J. & Marks, L.D., Ultramicroscopy, in press.Google Scholar
[8] Briscoe, N.A. & Hutchison, J.L., Inst. Phys. Conf. Ser. 68, 249 (1983).Google Scholar
[9] Iijima, S., Japan. J. Appl. Phys. 23, L347 (1984).10.1143/JJAP.23.L347Google Scholar
[10] Sinclair, R., Yamashita, T. & Ponce, F.A., Nature, 290, 386 (1982).10.1038/290386a0CrossRefGoogle Scholar
[11] Smith, D.J., Camps, R.A., Cosslett, V.E., Freeman, L.A., Saxton, W.O., Nixon, W.C., Ahmed, H., Catto, C.J.D., Cleaver, J.R.A., Smith, K.C.A. & Timbs, A.E., Ultramicroscopy 9, 203 (1982).10.1016/0304-3991(82)90201-7CrossRefGoogle Scholar
[12] Marks, L.D. & Smith, D.J., submitted to Surface Science.Google Scholar
[13] Ehrlich, G., CRC Crit. Rev. Solid State Mat. Sci. 4, 205 (1974).10.1080/10408437308245825CrossRefGoogle Scholar
[14] Bonzel, H.P., CRC Crit. Rev. Solid State Mat. Sci. 6, 171 (1976).10.1080/10408437608243554CrossRefGoogle Scholar
[15] Ayrault, G. & Ehrlich, G., J. Chem. Phys. 60, 281 (1974).10.1063/1.1680781CrossRefGoogle Scholar
[16] Ehrlich, G. and Hudda, F.G., J. Chem. Phys. 44, 1039 (1966).10.1063/1.1726787Google Scholar
[17] Wagner, H., Springer Tracts of Modern Physics, 85, 151.Google Scholar