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Electrochemical strain microscopy: Probing ionic and electrochemical phenomena in solids at the nanometer level

  • Scanning probes for new energy materials: Probing local structure and function
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Abstract

Atomistic and nanometer scale mechanisms of electrochemical reactions and ionic flows in solids in the nanometer–micron range persist as terra incognito in modern science. While structural and electronic phenomena are now accessible to electron and scanning probe microscopy (SPM) techniques, probing nanoscale electrochemistry requires the capability to probe local ionic currents. Here, we discuss principles and applications of electrochemical strain microscopy (ESM), a technique based on probing minute deformations induced by electric bias applied to an SPM tip. ESM imaging and spectroscopy are illustrated for several energy storage and conversion materials. We further argue that down-scaling of physical device structures based on oxides necessitates ionic and electrochemical effects to be taken into account. Future pathways for ESM development are discussed.

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Authors and Affiliations

  1. Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, TN, USA

    Stephen Jesse, Amit Kumar, Thomas M. Arruda, Yunseok Kim & Sergei V. Kalinin

  2. Hong Kong University of Science and Technology, Hong Kong

    Francesco Ciucci

Authors
  1. Stephen Jesse
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  2. Amit Kumar
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  3. Thomas M. Arruda
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  4. Yunseok Kim
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  5. Sergei V. Kalinin
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  6. Francesco Ciucci
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Correspondence to Stephen Jesse.

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Jesse, S., Kumar, A., Arruda, T.M. et al. Electrochemical strain microscopy: Probing ionic and electrochemical phenomena in solids at the nanometer level. MRS Bulletin 37, 651–658 (2012). https://doi.org/10.1557/mrs.2012.144

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