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Deformation microstructure under microindents in single-crystal Cu using three-dimensional x-ray structural microscopy

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Abstract

The use of three-dimensional x-ray structural microscopy for nondestructive investigations of the deformation microstructure under microindents was demonstrated. Point to point, micrometer-resolution x-ray microbeam measurements of local lattice rotations were made for selected positions under 100-mN Berkovich and conical indents in single-crystal copper. Local lattice orientation measurements were used to extract micrometer by micrometer lattice misorientations and rotation axes along x-ray microbeams. Measurements of the deformation microstructure in symmetry and off-symmetry geometries are reported and discussed in terms of their potential for fundamental deformation investigations.

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Authors and Affiliations

  1. Oak Ridge National Laboratory, Oak Ridge, Tennessee, 37831, USA

    Wenge Yang, B. C. Larson, G. M. Pharr, G. E. Ice, J. D. Budai, J. Z. Tischler & Wenjun Liu

  2. University of Tennessee, Knoxville, Tennessee, 37996, USA

    G. M. Pharr

Authors
  1. Wenge Yang
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  2. B. C. Larson
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  3. G. M. Pharr
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  4. G. E. Ice
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  6. J. Z. Tischler
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  7. Wenjun Liu
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This author was an editor of this focus issue during the review and decision stage. For the JMR policy on review and publication of manuscripts authored by editors, please refer to http://www.mrs.org/publications/jmr/policy.html

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Yang, W., Larson, B.C., Pharr, G.M. et al. Deformation microstructure under microindents in single-crystal Cu using three-dimensional x-ray structural microscopy. Journal of Materials Research 19, 66–72 (2004). https://doi.org/10.1557/jmr.2004.19.1.66

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  • DOI: https://doi.org/10.1557/jmr.2004.19.1.66

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