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Microwave dielectric properties and vibrational spectroscopic analysis of MgTe2O5 ceramics

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Abstract

MgTe2O5 ceramics were prepared by solid-state route. These materials were sintered in the temperature range of 640–720 °C. The structure and microstructure of the compound was investigated using x-ray diffraction (XRD), Fourier transform infrared (FTIR), Raman spectroscopy, and scanning electron microscopy (SEM) techniques. The dielectric properties of the ceramics were studied in the frequency range 4–6 GHz. The MgTe2O5 ceramics have a dielectric constant (ϵr) of 10.5, quality factors (Qu × f) of 61000 at 5.3 GHz, and temperature coefficient of resonant frequency (τf) of −45 ppm/°C at the optimized sintering temperature of 700 °C. The microwave dielectric properties of these materials at cryogenic temperatures were also investigated.

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Acknowledgment

G. Subodh is grateful to the Council of Scientific and Industrial Research (CSIR) New Delhi, India, for the award of a junior research fellowship.

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Authors and Affiliations

  1. Materials and Minerals Division, National Institute for Interdisciplinary Science and Technology (NIST), Trivandrum, 695 019, India

    G. Subodh

  2. Microwave Materials Division, Centre for Materials in Electronics (C-MET), Thrissur, 680 771, India

    R. Ratheesh

  3. School of Engineering, James Cook University, Townsville, QLD, 4811, Australia

    M.V. Jacob

  4. Materials and Minerals Division, National Institute for Interdisciplinary Science and Technology (NIST), Trivandrum, 695 019, India

    M.T. Sebastian

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  1. G. Subodh
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  2. R. Ratheesh
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Correspondence to M.T. Sebastian.

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Subodh, G., Ratheesh, R., Jacob, M. et al. Microwave dielectric properties and vibrational spectroscopic analysis of MgTe2O5 ceramics. Journal of Materials Research 23, 1551–1556 (2008). https://doi.org/10.1557/JMR.2008.0212

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