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Microscopy and Microanalysis (2004), 10 (Suppl. 02) : 134-135 Cambridge University Press
Copyright © 2004 Microscopy Society of America
doi:10.1017/S1431927604885738
Published online by Cambridge University Press 01 Aug 2004
 

Invited Paper


Advances in Instrumentation and Techniques - Scanned Probe Microscopy: Probing Surfaces at the Nanoscale

Molecular Design of Next-generation Single Walled Carbon Nanotubes-Polymer Composites

Lawrence A  Bottomley a1, Mark A  Poggi a1 and Peter Lillehei a2
a1 Georgia Institute of Technology
a2 NASA Langley Research Center, Hampton, Virginia

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.


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