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Microscopy and Microanalysis (2004), 10 (Suppl. 02) : 194-195 Cambridge University Press
Copyright © 2004 Microscopy Society of America
doi:10.1017/S1431927604882679
Published online by Cambridge University Press 01 Aug 2004
 
Microscopy and Microanalysis (2004), 10(Suppl 2):194-195CD Cambridge University Press
Copyright © 2004 Microscopy Society of America
doi:10.1017/S1431927604882679

Contributed Paper


Advances in Instrumentation and Techniques - Microscopy and Microanalysis in the Real World: Textiles, Pharmaceuticals, Photonics, and Biomedical/Forensics

Development of a STEM-EBIC/CL System for Structural, Compositional, Electrical, and Optical Characterization of Quantum Well Devices

K.L. Bunker a1, R. Garcia a1 and P.E. Russell a1
a1 North Carolina State University

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.


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