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Benefits of Combined Evaluation of EPMA and Micro-XRF Spectra of Same Specimen in Scanning Electron Microscopes

Published online by Cambridge University Press:  05 August 2007

F Eggert ,
T Elam  and
M Haschke
F Eggert
Affiliation:
Institut Fuer Angewandte Photonik,Germany
T Elam
Affiliation:
EDAX
M Haschke
Affiliation:
Institute For Scientific Instruments,Germany
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 1444 - 1445
Copyright
© 2007 Microscopy Society of America

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