Hostname: page-component-7c8c6479df-ph5wq Total loading time: 0 Render date: 2024-03-29T10:33:38.026Z Has data issue: false hasContentIssue false

Indentation mechanics of Cu–Be quantified by an in situ transmission electron microscopy mechanical probe

Published online by Cambridge University Press:  03 March 2011

M.S. Bobji*
Affiliation:
Department of Mechanical Engineering, Indian Institute of Science, Bangalore, 560 012 India
J.B. Pethica
Affiliation:
Department of Materials, University of Oxford, Oxford, OX1 3PH United Kingdom; and Physics Department, Trinity College, Dublin 2, Ireland
B.J. Inkson
Affiliation:
Department of Engineering Materials, The University of Sheffield, Sheffield, S1 3JD United Kingdom
*
a)Address all correspondence to this author. e-mail: bobji@mecheng.iisc.erent.in
Get access

Abstract

In situ transmission electron microscopy was used to study, in real time, the sub-surface deformation taking place in Cu–Be alloy during nanoindentation. A twinned region of the material was indented with a sharp tungsten tip in a specially developed transmission electron microscopy (TEM) holder. A flexible hinge-based force sensor was used to measure the force on the indenter, and the force–displacement curve for the tip was obtained by tracking the tip in the sequential images of a TEM video of the indentation process. Step-like structures ∼50 nm in size resulting from the tip surface roughness were observed to generate clusters of dislocations in the sample when they come in contact with the softer Cu–Be. With this setup, the forces and the mean pressure associated with such an individual deformation event in a nanostructured TEM sample were measured.

Type
Articles
Copyright
Copyright © Materials Research Society 2005

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1Haque, M.A. and Saif, M.T.A.: In situ tensile testing of nano-scale specimens in SEM and TEM. Exp. Mech. 42, 123 (2002).Google Scholar
2Kizuka, T., Yamada, K., Deguchi, S., Naruse, M. and Tanaka, N.: Cross-sectional time-resolved high-resolution transmission electron microscopy of atomic-scale contact and noncontact-type scannings on gold surfaces. Phys. Rev. B 55 R7398 (1997).Google Scholar
3Erts, A.: Lõhmus, R.Lõhmus, H. Olin, A.V. Pokropivny, L. Ryen, and K. Svensson: Force interactions and adhesion of gold contacts using a combined atomic force microscope and transmission electron microscope. Appl. Surf. Sci. 188, 460 (2002).Google Scholar
4Wall, M.A. and Dahmen, U.: An in situ nanoindentation specimen holder for a high voltage transmission electron microscope. Microsc. Res. Technol. 42, 248 (1998).Google Scholar
5Minor, A.M., Morris, J.W.Jr., and Stach, E.A.: Quantitative in situ nanoindentation in an electron microscope. Appl. Phys. Lett. 79, 1625 (2001).Google Scholar
6Bobji, M.S., Ramanujan, C.S., Doole, R.C., Pethica, J.B., and Inkson, B.J.: An in situ TEM nanoindenter system with 3-axis inertial positioner, in Mechanical Properties Derived from Nanostructuring Materials, edited by Bahr, D.F., Kung, H., Moody, N.R., and Wahl, K.J. (Mater. Res. Soc. Symp. Proc. 778, Warrendale, PA, 2003), p. 105.Google Scholar
7Bobji, M.S., Ramanujan, C.S., Pethica, J.B., and Inkson, B.J.: Proceedings of International Congress on Electron Microscopy, Durban, 941(2002).Google Scholar
8Bobji, M.S., Ramanujan, C.S., Pethica, J.B., and Inkson, B.J.: A miniaturized TEM nanoindenter for studying material deformation in situ. Meas. Sci. Technol., (submitted).Google Scholar
9Johnson, K.L.: Contact Mechanics (Cambridge University Press, Cambridge, U.K., 1985).Google Scholar
10Oliver, W.C. and Pharr, G.M.: An improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experiments. J. Mater. Res. 7, 1564 (1992).Google Scholar
11Doerner, M.F. and Nix, W.D.: A method for interpreting the data from depth-sensing indentation instruments. J. Mater. Res. 1, 610 (1986).Google Scholar
12Herrmann, K., Jennett, N.M., Wegener, W., Meneve, J., Hasche, K. and Seemann, R.: Progress in determination of the area function of indenters used for nanoindentation. Thin Solid Films 377–378, 394 (2000).Google Scholar
13Bobji, M.S. and Biswas, S.K.: Deconvolution of hardness from data obtained from nanoindentation of rough surfaces. J. Mater. Res. 14, 2259 (1999).Google Scholar
14Weiss, H-J.: On deriving Vickers hardness from penetration depth. Phys. Status Solidi A99, 491 (1987).Google Scholar