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Improving Fabrication and Application of Zach Phase Plates for Phase-Contrast Transmission Electron Microscopy

Published online by Cambridge University Press:  12 October 2012

Simon Hettler*
Affiliation:
Laboratorium für Elektronenmikroskopie, Karlsruher Institut für Technologie (KIT), 76128 Karlsruhe, Germany
Björn Gamm
Affiliation:
Laboratorium für Elektronenmikroskopie, Karlsruher Institut für Technologie (KIT), 76128 Karlsruhe, Germany
Manuel Dries
Affiliation:
Laboratorium für Elektronenmikroskopie, Karlsruher Institut für Technologie (KIT), 76128 Karlsruhe, Germany
Nicole Frindt
Affiliation:
CellNetworks, BioQuant, Universität Heidelberg, 69120 Heidelberg, Germany
Rasmus R. Schröder
Affiliation:
CellNetworks, BioQuant, Universität Heidelberg, 69120 Heidelberg, Germany
Dagmar Gerthsen
Affiliation:
Laboratorium für Elektronenmikroskopie, Karlsruher Institut für Technologie (KIT), 76128 Karlsruhe, Germany
*
*Corresponding author. E-mail: simon.hettler@kit.edu
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Abstract

Zach phase plates (PPs) are promising devices to enhance phase contrast in transmission electron microscopy. The Zach PP shifts the phase of the zero-order beam by a strongly localized inhomogeneous electrostatic potential in the back focal plane of the objective lens. We present substantial improvements of the Zach PP, which overcome previous limitations. The implementation of a microstructured heating device significantly reduces contamination and charging of the PP structure and extends its lifetime. An improved production process allows fabricating PPs with reduced dimensions resulting in lower cut-on frequencies as revealed by simulations of the electrostatic potential. Phase contrast with inversion of PbSe nanoparticles is demonstrated in a standard transmission electron microscope with LaB6 cathode by applying different voltages.

Type
Techniques and Equipment Development
Copyright
Copyright © Microscopy Society of America 2012

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References

Alloyeau, D., Hsieh, W.K., Anderson, E.H., Hilken, L., Benner, G., Meng, X., Chen, F.R. & Kisielowsky, C. (2010). Imaging of soft and hard materials using a Boersch phase plate in a transmission electron microscope. Ultramicroscopy 110, 563570.CrossRefGoogle Scholar
Boersch, H. (1947). Über die Kontraste von Atomen im Elektronenmikroskop. Z Naturforsch 2a, 615633.Google Scholar
Cambie, R., Downing, K.H., Typke, D., Glaeser, R.M. & Jin, J. (2007). Design of a microfabricated, two-electrode phase-contrast element suitable for electron microscopy. Ultramicroscopy 107, 329339.Google Scholar
Danev, R., Glaeser, R.M. & Nagayama, K. (2009). Practical factors affecting the performance of a thin-film phase plate for transmission electron microscopy. Ultramicroscopy 109, 312325.Google Scholar
Danev, R. & Nagayama, K. (2001a). Transmission electron microscopy with Zernike phase plate. Ultramicroscopy 88, 243252.Google Scholar
Danev, R. & Nagayama, K. (2001b). Complex observation in electron microscopy. II. Direct visualization of phases and amplitudes of exit wave functions. J Phys Soc Jpn 70, 696702.Google Scholar
Gamm, B., Dries, M., Schultheiss, K., Blank, H., Rosenauer, A., Schröder, R.R. & Gerthsen, D. (2010). Object wave reconstruction by phase-plate transmission electron microscopy. Ultramicroscopy 110, 807814.Google ScholarPubMed
Müller, H., Jin, J., Danev, R., Spence, J., Padmore, H. & Glaser, R.M. (2010). Design of an electron microscope phase plate using a focused continuous-wave laser. New J Phys 12, 073011. Google Scholar
Rose, H. (2010). Theoretical aspects of image formation in the aberration-corrected electron microscope. Ultramicroscopy 110, 488499.Google Scholar
Schröder, R.R., Barton, B., Rose, H. & Benner, G. (2007). Contrast enhancement by anamorphotic phase plates in an aberration-corrected TEM. Microsc Microanal 13, 136137.Google Scholar
Schultheiss, K., Pérez-Willard, F., Barton, B., Gerthsen, D. & Schroeder, R.R. (2006). Fabrication of a Boersch phase plate for phase contrast imaging in a transmission electron microscope. Rev Sci Instrum 77, 033701. Google Scholar
Schultheiss, K., Zach, J., Gamm, B., Dries, M., Frindt, N., Schröder, R.R. & Gerthsen, D. (2010). New electrostatic phase plate for phase-contrast transmission electron microscopy and its application for wave-function reconstruction. Microsc Microanal 16, 785794.Google Scholar
Shiue, J., Chang, C.-S., Huang, S.-H., Hsu, C.-H., Tsai, J.-S., Chang, W.-H., Wu, Y.-M., Lin, Y.-C., Kuo, P.-C., Huang, Y.-S., Hwu, Y., Kai, J.-J., Tseng, F.-G. & Chen, F.-R. (2009). Phase TEM for biological imaging utilizing a Boersch electrostatic phase plate: Theory and practice. J Electron Microsc 58, 137145.Google Scholar
Zernike, F. (1942). Phase contrast, a new method for the microscopic observation of transparent objects. Physica 9, 686698.Google Scholar