Hostname: page-component-8448b6f56d-cfpbc Total loading time: 0 Render date: 2024-04-18T21:36:05.664Z Has data issue: false hasContentIssue false
  • English
  • Français

Atomic-Resolution Environmental Transmission Electron Microscopy for Probing Gas–Solid Reactions in Heterogeneous Catalysis

Published online by Cambridge University Press:  31 January 2011

Pratibha L. Gai ,
Edward D. Boyes ,
Stig Helveg ,
Poul L. Hansen ,
Suzanne Giorgio  and
Claude R. Henry
Get access

Abstract

Advances in atomic-resolution environmental transmission electron microscopy (ETEM) and related techniques for probing gas–solid reactions in situ are described. The capabilities of ETEM allow the dynamic nanostructure of heterogeneous catalysts in their functioning states to be directly monitored in real time. Applications of ETEM in catalysis are outlined, and they illustrate significant new insights into the dynamic nanostructure of the catalyst materials and their modes of operation.

Type
Research Article
Information
MRS Bulletin , Volume 32 , Issue 12: Novel In Situ Probes for Nanocatalysis , December 2007 , pp. 1044 - 1050
Copyright
Copyright © Materials Research Society 2007

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Gai-Boyes, P. L., Catal. Rev. Sci. Eng. 34, 1 (1992).CrossRefGoogle Scholar
2.Gai, P.L., Boyes, E.D., Electron Microscopy in Heterogeneous Catalysis (Institute of Physics Publishing, London, 2003).CrossRefGoogle Scholar
3.Butler, E.P., Hale, K.F., Dynamic Experiments (North Holland, Amsterdam, 1981).Google Scholar
4.Gai, P.L., Smith, B.C., Owen, G., Nature 348, 430 (1990).Google Scholar
5.Topsøe, H., J. Catal. 216, 155 (2003).CrossRefGoogle Scholar
6.Sharma., R., Microsc. Microanal. 7, 494 (2001).CrossRefGoogle Scholar
7.Gai, P.L., Kourtakis, K., Science 267, 661 (1995).CrossRefGoogle Scholar
8.Boyes, E.D., Gai, P.L., Ultramicroscopy 67, 219 (1997).CrossRefGoogle Scholar
9.Haggin, J., Chem. Eng. News 73 (30), 39 (1995).CrossRefGoogle Scholar
10.Jacoby, M., Chem. Eng. News 80 (31), 26 (2002).CrossRefGoogle Scholar
11.Thomas, J.M., Gai, P.L., Adv. Catal. 48, 171 (2004).CrossRefGoogle Scholar
12.Gai, P.L., Calvino, J.J., Annu. Rev. Mater. Res. 35, 465 (2005).CrossRefGoogle Scholar
13.Datye, A., Hansen, P.L., Helveg, S., Adv. Catal. 50, 77 (2006).Google Scholar
14.Stach, E., Microsc. Microanal. (In situ Tutorials) 12, 2 (2006).Google Scholar
15.Sharma, R., Weiss, K., Microsc. Res. Technol. 42, 270 (1998).3.0.CO;2-U>CrossRefGoogle Scholar
16.Gai, P.L., Acta. Crystallogr. B53, 346 (1997); P.L. Gai, Adv. Mater. 10, 1259 (1998).CrossRefGoogle Scholar
17.Gai, P.L., Nanocharacterisation (RSC Nanoscience and Nanotechnology, A., Kirkland, J., Hutchison, Eds. (Royal Society of Chemistry, London, 2007) Ch. 7, p. 268.Google Scholar
18.Gai, P.L., Top. Catal. 9, 19 (1999).Google Scholar
19.Gai, P.L., Top. Catal. 21, 161 (2002).CrossRefGoogle Scholar
20.Boyes, E.D., Gai, P.L., Microsc. Today 12, 24 (2004).CrossRefGoogle Scholar
21.Gai, P.L., Torardi, C.C., Boyes, E.D., Turning Points in Solid State Chemistry (Royal Society of Chemistry, London, 2007), Ch. 45, p. 745.Google Scholar
22.Gai, P.L., Kourtakis, K., Boyes, E.D., Catal. Lett. 102 (1–2), 1 (2005).CrossRefGoogle Scholar
23.Daulton, T., Little, B., Lowe, K., Jones-Meehan, J., Microsc. Microanal. 7, 470 (2001).CrossRefGoogle Scholar
24.Giorgio, S., Joao, S. Sao, Nitsche, S., Sitja, G., Henry, C.R., Ultramicroscopy 106 (6), 503 (2006).CrossRefGoogle Scholar
25.Zanella, R., Louis, C., Shin, C., Giorgio, S., Henry, C., J. Catal. 222, 357 (2004).CrossRefGoogle Scholar
26.Joao, S.Sao, Giorgio, S., Henry, C., Chapon, C., Bourgeois, S., Penisson, J.M., J. Phys. Chem. B 109, 342 (2005).CrossRefGoogle Scholar
27.Baker, R.T., Catal. Rev. Sci. Eng. 19, 161 (1979).CrossRefGoogle Scholar
28.Sharma, R., Crozier, P., in Handbook for Microscopy, Yao, N., Wang, Z., Eds. (Kluwer, 2005) Ch. 17.Google Scholar
29.Clausen, B.S., Schiøtz, J., Grabarek, L., Ovesen, C.V., Jacobsen, K., Nørskov, J.K., Topsøe, H., Top. Catal. 1, 367 (1994).CrossRefGoogle Scholar
30.Grunwaldt, J.D., Molenbroek, A.M., Topsøe, N.-Y., Topsøe, H., Clausen, B.S., J. Catal. 194, 453 (2000).CrossRefGoogle Scholar
31.Ovesen, C.V., Clausen, B.S., Schiøtz, J., Stoltz, P., Topsøe, H., Nørskov, J.K., J. Catal. 168. 133 (1997).CrossRefGoogle Scholar
32.Hansen, P.L., Wagner, J.B., Helveg, S., Rostrup-Nielsen, J.R., Clausen, B.S., Topsøe, H., Science 295, 2053 (2002).CrossRefGoogle Scholar
33.Wagner, J.B., Hansen, P.L., Molenbroek, A.M., Topsøe, H., Clausen, B.S., Helveg, S., J. Phys. Chem. B 107, 7753 (2003).CrossRefGoogle Scholar
34.Helveg, S., Hansen, P.L., Catal. Today 111, 68 (2005).CrossRefGoogle Scholar
35.Honkala, K., Hellman, A., Remediakis, I.N., Logadottir, A., Carlsson, A., Dahl, S., Christensen, C.H., Nørskov, J.K., Science 307, 555 (2005).CrossRefGoogle Scholar
36.Rostrup-Nielsen, J.R., Sehested, J., Nørskov, J.K., Adv. Catal. 47, 65 (2002).CrossRefGoogle Scholar
37.de Jong, K.P., Geus, J.W., Catal. Rev. Sci. Eng. 42 (4), 481 (2000).CrossRefGoogle Scholar
38.Terrones, M., Int. Mater. Rev. 49, 325 (2005).CrossRefGoogle Scholar
39.Baker, R.T.K., Barber, M., Harris, P., Fetes, S., White, R.J., J. Catal. 26, 51 (1972).CrossRefGoogle Scholar
40.Helveg, S., Lopez-Cartes, C., Sehested, J., Hansen, P.L., Clausen, B.S., Rostrup-Nielsen, J.R., Abild-Pedersen, F., Nørskov, J.K., Nature 427, 426 (2004).CrossRefGoogle Scholar
41.Bengaard, H.S., Nørskov, J.K., Sehested, J., Clausen, B.S., Nielsen, L.P., Molenbroek, A.M., Rostrup-Nielsen, J.R., J. Catal. 209, 365 (2002).CrossRefGoogle Scholar
42.Abild-Pedersen, F., Nørskov, J.K., Rostrup-Nielsen, J.R., Sehested, J., Helveg, S., Phys. Rev. B 73, 115419 (2006).CrossRefGoogle Scholar
43.Jaeger, N., Science 293, 1601 (2001).CrossRefGoogle ScholarPubMed