Gallium Phase Formation in Cu During 30kV Ga+ FIB Milling

JR Michael

doi:10.1017/S1431927606062015

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

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MoberlyChan, Warren J. Adams, David P. Aziz, Michael J. Hobler, Gerhard and Schenkel, Thomas 2007. Fundamentals of Focused Ion Beam Nanostructural Processing: Below, At, and Above the Surface. MRS Bulletin, Vol. 32, Issue. 5, p. 424.

Mayer, Joachim Giannuzzi, Lucille A. Kamino, Takeo and Michael, Joseph 2007. TEM Sample Preparation and FIB-Induced Damage. MRS Bulletin, Vol. 32, Issue. 5, p. 400.

Yin, K.B. Xia, Y.D. Chan, C.Y. Zhang, W.Q. Wang, Q.J. Zhao, X.N. Li, A.D. Liu, Z.G. Bayes, M.W. and Yee, K.W. 2008. The kinetics and mechanism of room-temperature microstructural evolution in electroplated copper foils. Scripta Materialia, Vol. 58, Issue. 1, p. 65.

Giannuzzi, Lucille A. Utlaut, Mark and Swanson, Lynwood 2008. EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany. p. 665.

Wright, Stuart I. and Nowell, Matthew M. 2009. Electron Backscatter Diffraction in Materials Science. p. 329.

El-Awady, Jaafar A. Woodward, Christopher Dimiduk, Dennis M. and Ghoniem, Nasr M. 2009. Effects of focused ion beam induced damage on the plasticity of micropillars. Physical Review B, Vol. 80, Issue. 10,

Simões, S. Viana, F. Ramos, A.S. Vieira, M.T. and Vieira, M.F. 2010. TEM Characterization of As-Deposited and Annealed Ni/Al Multilayer Thin Film. Microscopy and Microanalysis, Vol. 16, Issue. 6, p. 662.

Giannuzzi, L.A. and Utlaut, M. 2011. Non-monotonic material contrast in scanning ion and scanning electron images. Ultramicroscopy, Vol. 111, Issue. 11, p. 1564.

Wenk, Hans‐Rudolf 2012. Modern Diffraction Methods. p. 173.

Punzhin, Sergey Detsi, Eric Kuzmin, Alexey and De Hosson, Jeff Th. M. 2014. Deformation of nanoporous nanopillars by ion beam-induced bending. Journal of Materials Science, Vol. 49, Issue. 16, p. 5598.

Siemons, W. Beekman, C. Fowlkes, J. D. Balke, N. Tischler, J. Z. Xu, R. Liu, W. Gonzales, C. M. Budai, J. D. and Christen, H. M. 2014. Focused-ion-beam induced damage in thin films of complex oxide BiFeO3. APL Materials, Vol. 2, Issue. 2,

Macholdt, Dorothea S. Förster, Jan-David Müller, Maren Weber, Bettina Kappl, Michael Kilcoyne, A. L. David Weigand, Markus Leitner, Jan Jochum, Klaus Peter Pöhlker, Christopher and Andreae, Meinrat O. 2019. Artifacts from manganese reduction in rock samples prepared by focused ion beam (FIB) slicing for X-ray microspectroscopy. Geoscientific Instrumentation, Methods and Data Systems, Vol. 8, Issue. 1, p. 97.

Zhou, Qi Hu, Rong and Sha, Gang 2021. A new mechanism of surface phase formation on precipitation-hardening alloy under ion irradiation. Applied Surface Science, Vol. 563, Issue. , p. 150358.

Wolff, Annalena 2021. Is the Ne operation of the helium ion microscope suitable for electron backscatter diffraction sample preparation?. Beilstein Journal of Nanotechnology, Vol. 12, Issue. , p. 965.

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Gallium Phase Formation in Cu During 30kV Ga+ FIB Milling

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