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Top 10 Most-Cited Articles


These are the top 10 most-cited articles for this title. Most-cited rankings are updated on a monthly basis and provided by CrossRef.

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Automated Analysis of SEM X-Ray Spectral Images: A Powerful New Microanalysis Tool

Paul G. Kotula, Michael R. Keenan and Joseph R. Michael

Microscopy and Microanalysis, Volume 9, Issue 01, Feb 2003, pp 1-17
doi: 10.1017/S1431927603030058 (About doi), Published online by Cambridge University Press 31 Jan 2003
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First Data from a Commercial Local Electrode Atom Probe (LEAP)

Thomas F. Kelly, Tye T. Gribb, Jesse D. Olson, Richard L. Martens, Jeffrey D. Shepard, Scott A. Wiener, Thomas C. Kunicki, Robert M. Ulfig, Daniel R. Lenz, Eric M. Strennen, Edward Oltman, Joseph H. Bunton and David R. Strait

Microscopy and Microanalysis, Volume 10, Issue 03, Jun 2004, pp 373-383
doi: 10.1017/S1431927604040565 (About doi), Published online by Cambridge University Press 01 Jun 2004
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Iterative X-ray Cone-Beam Tomography for Metal Artifact Reduction and Local Region Reconstruction

Ge Wang, Michael W. Vannier and Ping-Chin Cheng

Microscopy and Microanalysis, Volume 5, Issue 01, Jan 1999, pp 58-65
doi: 10.1017/S1431927699000057 (About doi), Published online by Cambridge University Press 31 Jul 2002
 
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The Pros and Cons of Apoptosis Assays for Use in the Study of Cells, Tissues, and Organs

Michiko Watanabe, Midori Hitomi, Kathy van der Wee, Florence Rothenberg, Steven A. Fisher, Robert Zucker, Kathy K.H. Svoboda, Edie C. Goldsmith, Kaisa M. Heiskanen and Anna-Liisa Nieminen

Microscopy and Microanalysis, Volume 8, Issue 05, Oct 2002, pp 375-391
doi: 10.1017/S1431927602010346 (About doi), Published online by Cambridge University Press 27 Nov 2002
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Simultaneous Mechanical Loading and Confocal Reflection Microscopy for Three-Dimensional Microbiomechanical Analysis of Biomaterials and Tissue Constructs

Sherry L. Voytik-Harbin, Blayne A. Roeder, Jennifer E. Sturgis, Klod Kokini and J. Paul Robinson

Microscopy and Microanalysis, Volume 9, Issue 01, Feb 2003, pp 74-85
doi: 10.1017/S1431927603030046 (About doi), Published online by Cambridge University Press 31 Jan 2003
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High-Resolution Transmission Electron Microscopy Using Negative Spherical Aberration

Chun-Lin Jia, Markus Lentzen, and Knut Urban

Microscopy and Microanalysis, Volume 10, Issue 02, Apr 2004, pp 174-184
doi: 10.1017/S1431927604040425 (About doi), Published online by Cambridge University Press 17 Mar 2004
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Thin Dielectric Film Thickness Determination by Advanced Transmission Electron Microscopy

A.C. Diebold, B. Foran, C. Kisielowski, D.A. Muller, S.J. Pennycook, E. Principe and S. Stemmer

Microscopy and Microanalysis, Volume 9, Issue 06, Dec 2003, pp 493-508
doi: 10.1017/S1431927603030629 (About doi), Published online by Cambridge University Press 21 Nov 2003
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“Indirect” High-Resolution Transmission Electron Microscopy: Aberration Measurement and Wavefunction Reconstruction

Angus I. Kirkland and Rüdiger R. Meyer

Microscopy and Microanalysis, Volume 10, Issue 04, Aug 2004, pp 401-413
doi: 10.1017/S1431927604040437 (About doi), Published online by Cambridge University Press 01 Aug 2004
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Automated Three-Dimensional Tracing of Neurons in Confocal and Brightfield Images

Wenyun He, Thomas A. Hamilton, Andrew R. Cohen, Timothy J. Holmes, Christopher Pace, Donald H. Szarowski, James N. Turner and Badrinath Roysam

Microscopy and Microanalysis, Volume 9, Issue 04, Aug 2003, pp 296-310
doi: 10.1017/S143192760303040X (About doi), Published online by Cambridge University Press 01 Aug 2003
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Characterization of Tungsten Surfaces by Simultaneous Work Function and Secondary Electron Emission Measurements

Gy. Vida, V.K. Josepovits, M. Gyor and P. Deák

Microscopy and Microanalysis, Volume 9, Issue 04, Aug 2003, pp 337-342
doi: 10.1017/S143192760303023X (About doi), Published online by Cambridge University Press 01 Aug 2003
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