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Time-of-Flight Technique Limits of Applicability for Thin-Films of Π-Conjugated Polymers

Published online by Cambridge University Press:  14 February 2012

Marco R. Cavallari ,
Vinicius R. Zanchin ,
Cleber A. Amorim ,
Gerson dos Santos ,
Fernando J. Fonseca ,
Adnei M. Andrade  and
Sergio Mergulhão
Marco R. Cavallari
Affiliation:
Escola Politécnica da Universidade de São Paulo (EPUSP), Departamento de Engenharia de Sistemas Eletrônicos. Av. Prof. Luciano Gualberto, trav. 3, n. 158, Cidade Universitária São Paulo, SP 05508-900, Brasil
Vinicius R. Zanchin
Affiliation:
Escola Politécnica da Universidade de São Paulo (EPUSP), Departamento de Engenharia de Sistemas Eletrônicos. Av. Prof. Luciano Gualberto, trav. 3, n. 158, Cidade Universitária São Paulo, SP 05508-900, Brasil
Cleber A. Amorim
Affiliation:
Departamento de Física, UFSCar, CP 676 São Carlos, SP 13565-905, Brasil
Gerson dos Santos
Affiliation:
Escola Politécnica da Universidade de São Paulo (EPUSP), Departamento de Engenharia de Sistemas Eletrônicos. Av. Prof. Luciano Gualberto, trav. 3, n. 158, Cidade Universitária São Paulo, SP 05508-900, Brasil
Fernando J. Fonseca
Affiliation:
Escola Politécnica da Universidade de São Paulo (EPUSP), Departamento de Engenharia de Sistemas Eletrônicos. Av. Prof. Luciano Gualberto, trav. 3, n. 158, Cidade Universitária São Paulo, SP 05508-900, Brasil
Adnei M. Andrade
Affiliation:
Instituto de Eletrotécnica e Energia, USP. Av. Prof. Luciano Gualberto, 1289, Butantã São Paulo, SP 05508-970, Brasil
Sergio Mergulhão*
Affiliation:
Departamento de Física, UFSCar, CP 676 São Carlos, SP 13565-905, Brasil
*
*Phone 1: +551633518222; Phone 2: +551633518226; E-mail: dsme@df.ufscar.br
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Abstract

Time of flight (ToF) is the most straightforward technique to determine polymeric semiconductor mobility for electronic applications. We demonstrate ToF limits of applicability to amorphous PPV derivatives, such as poly[2-methoxy-5-(3’,7’-dimethylloctyloxy)-1-4-phenylene vinylene] (MDMO-PPV) and poly[2-methoxy-5-(2’-ethylhexyloxy)-1-4-phenylene vinylene] (MEH-PPV), and polycrystalline poly(3-hexylthiophene) (P3HT). Hole and electron mobility (μ) in submicrometric films (200 – 500 nm) is overestimated compared to casted layers, due to reduced absorption capability, which is confirmed by Charge Extraction by Linearly Increasing Voltage (CELIV) measurements. Charge transport properties in nanometric films, such as for Field-Effect Transistors (FET), can not be studied by current-mode ToF. Hole mobility of ca. 10-5 cm2/Vs with Poole-Frenkel behavior for PPV derivatives and 10-3 cm2/Vs for P3HT is at least one order of magnitude higher than ToF results.

Keywords

electronic materialpolymersemiconducting
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1402: Symposium U – Charge Generation/Transport in Organic Semiconductor Materials , 2012 , mrsf11-1402-u08-03
Copyright
Copyright © Materials Research Society 2012

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