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Electronic transport properties of top-gated monolayer and bilayer graphene devices on SiC

Published online by Cambridge University Press:  31 March 2011

Shinichi Tanabe
Affiliation:
NTT Basic Research Laboratories, 3-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0198, Japan
Yoshiaki Sekine
Affiliation:
NTT Basic Research Laboratories, 3-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0198, Japan
Hiroyuki Kageshima
Affiliation:
NTT Basic Research Laboratories, 3-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0198, Japan
Masao Nagase
Affiliation:
NTT Basic Research Laboratories, 3-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0198, Japan
Hiroki Hibino
Affiliation:
NTT Basic Research Laboratories, 3-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0198, Japan
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Abstract

We studied the electronic transport properties of monolayer and bilayer graphene in top-gated geometries. Monolayer and bilayer graphene were epitaxially grown by thermal decomposition of SiC. The half-integer quantum Hall effect under the gated environment was observed in monolayer graphene devices. The mobility of the monolayer and bilayer graphene devices showed distinct characteristics as a function of carrier density, which reflect their electronic structures. Strong temperature dependence at the charge neutrality point was observed in bilayer graphene devices, suggesting band gap opening.

Type
Research Article
Copyright
Copyright © Materials Research Society 2011

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References

REFERENCES

1. Castro Neto, A. H., Guinea, F., Peres, N. M. R., Novoselov, K. S., and Geim, A. K., Rev. Mod. Phys. 81, 109 (2009).Google Scholar
2. Bolotin, K. I., Sikes, K. J., Jiang, Z., Klima, M., Fudenberg, G., Hone, J., Kim, P., and Stormer, H. L., Solid State Commun. 146, 351 (2008).Google Scholar
3. McCann, E. and Fal’ko, V. I., Phys. Rev. Lett. 96, 086805 (2006).Google Scholar
4. McCann, E., Phys. Rev. B 74, 161403 (2006).10.1103/PhysRevB.74.161403Google Scholar
5. Ohta, T., Bostwick, A., Seyller, T., Horn, K., and Rotenberg, E., Science 313, 951 (2006).Google Scholar
6. Novoselov, K. S., Geim, A. K., Morozov, S. V., Jiang, D., Zhang, Y., Dubonos, S. V., Grigorieva, I. V., and Firsov, A. A., Science 306, 666 (2004).Google Scholar
7. Berger, C., Song, Z., Li, X., Wu, X., Brown, N., Mayou, C. N. D., Li, T., Hass, J., Marchenkov, A. N., Conrad, E. H., First, P. N., and de Heer, W. A., Science 312, 1191 (2006).Google Scholar
8. Kim, K. S., Zhao, Y., Jang, H., Lee, S. Y., Kim, J. M., Kim, K. S., Ahn, J. H., Kim, P., Choi, J. Y., and Hong, B. H., Nature 457, 706 (2009).Google Scholar
9. Emtsev, K. V., Bostwick, A., Horn, K., Jobst, J., Kellogg, G. L., Ley, L., McChesney, J. L., Ohta, T., Reshanov, S. A., Rohrl, J., Rotenberg, E., Schmid, A. K., Waldmann, D., Weber, H. B., and Seyller, T., Nature. Mater. 8, 203 (2009).Google Scholar
10. Kageshima, H., Hibino, H., and Nagase, M., Mater. Sci. Forum 645-648, 597 (2010).Google Scholar
11. Hibino, H., Kageshima, H., and Nagase, M., J. Phys. D: Appl. Phys. 43, 374005 (2010).Google Scholar
12. Tanabe, S., Sekine, Y., Kageshima, H., Nagase, M., and Hibino, H., Appl. Phys. Exp. 3, 075102 (2010).Google Scholar
13. Hibino, H., Mizuno, S., Kageshima, H., Nagase, M., and Yamaguchi, H., Phys. Rev. B 80, 085406 (2009).10.1103/PhysRevB.80.085406Google Scholar
14. Zhu, W., Perebeinos, V., Freitag, M., and Avouris, P., Phys. Rev. B 80, 235402 (2009).Google Scholar
15. Chen, J. H., Jang, C., Xiao, S., Ishigami, M., and Fuhrer, M., Nature Nanotech. 3, 206 (2008).Google Scholar
16. Ohta, T., Bostwick, A., McChesney, J. L., Seyller, T., Horn, K., and Rotenberg, E., Phys. Rev. Lett. 98, 206802 (2007).Google Scholar
17. Bolotin, K. I., Sikes, K. J., Hone, J., Stormer, H. L., and Kim, P., Phys. Rev. Lett. 101, 096802 (2008).Google Scholar
18. Oostinga, J. B., Heersche, H. B., Liu, X., Morpurgo, A. F., and Vandersypen, L. M. K., Nature Mater. 7, 151 (2008).Google Scholar
19. Miyazaki, H., Tsukagoshi, K., Kanda, A., Otani, M., and Okada, S., Nano Lett. 10, 3888 (2010).10.1021/nl1015365Google Scholar
20. Tanabe, S., Sekine, Y., Kageshima, H., Nagase, M., and Hibino, H., Jpn. J. Appl. Phys. in press.Google Scholar