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Transmission electron microscopy with in situ ion irradiation

Published online by Cambridge University Press:  10 February 2015

Jonathan Andrew Hinks
Jonathan Andrew Hinks*
Affiliation:
Computing and Engineering, University of Huddersfield, Queensgate, Huddersfield HD1 3DH, United Kingdom
*
a)Address all correspondence to this author. e-mail: j.a.hinks@hud.ac.uk
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Abstract

The macroscopic properties of materials exposed to irradiation are determined by radiation damage effects which occur on the nanoscale. These phenomena are complex dynamic processes in which many competing mechanisms contribute to the evolution of the microstructure and thus to its end-state. To explore and understand the behavior of existing materials and to develop new technologies, it is highly advantageous to be able to observe the microstructural effects of irradiation as they occur. Transmission electron microscopy with in situ ion irradiation is ideally suited to this kind of study. This review focuses on some of the important factors in designing this type of experiment including sample preparation and ion beam selection. Also presented are a brief history of the development of this technique and an overview of the instruments in operation today including the latest additions.

Keywords

transmission electron microscopy (TEM)ion–solid interactionsradiation effects
Type
Invited Reviews
Information
Journal of Materials Research , Volume 30 , Issue 9: Focus Issue: Characterization and Modeling of Radiation Damage on Materials: State of the Art, Challenges, and Protocols , 14 May 2015 , pp. 1214 - 1221
Copyright
Copyright © Materials Research Society 2015 

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Footnotes

Contributing Editor: Khalid Hattar

References

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