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In situ TEM study on the microstructural evolution during electric fatigue in 0.7Pb(Mg1/3Nb2/3)O3–0.3PbTiO3 ceramic

Published online by Cambridge University Press:  28 August 2014

Hanzheng Guo ,
Xiaoli Tan  and
Shujun Zhang
Hanzheng Guo*
Affiliation:
Department of Materials Science and Engineering, Iowa State University, Ames, Iowa 50011, USA
Xiaoli Tan
Affiliation:
Department of Materials Science and Engineering, Iowa State University, Ames, Iowa 50011, USA
Shujun Zhang
Affiliation:
Materials Research Institute, Pennsylvania State University, University Park, Pennsylvania 16802, USA
*
a)Address all correspondence to this author. e-mail: ghanzheng@gmail.com
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Abstract

In this work, we report an experimental technique with nanometer resolution to reveal the microstructural mechanism for electric fatigue in ferroelectrics. The electric field in situ transmission electron microscopy (TEM) was used to directly visualize the domain evolution during the fatigue process in a 0.7Pb(Mg1/3Nb2/3)O3–0.3PbTiO3 ceramic. The structure–property relationship was well demonstrated by combining the microscopic observations with corresponding dielectric, piezoelectric, and ferroelectric properties measured on bulk specimens. It was found that the domain switching capability was substantially suppressed after 103 cycles of bipolar fields, leading to an immobilized domain configuration thereafter. Correspondingly, a pronounced degradation of the functionality of the ceramic was manifested, accompanying with a coercive field bumping and polarization current density peak broadening. The reduction of the polarization, dielectric constant, and piezoelectric coefficient were found to follow a power-law relation. Seed inhibition mechanism was suggested to be responsible for the observed fatigue behaviors.

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Articles
Information
Journal of Materials Research , Volume 30 , Issue 3: Focus Issue: In-situ and Operando Characterization of Materials , 14 February 2015 , pp. 364 - 372
Copyright
Copyright © Materials Research Society 2014 

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References

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