An X-Ray powder diffraction study of ultra-dispersed polytetrafluoroethylene was carried out. As well as a regular polytetrafluoroethylene the ultra-dispersed form contents a high proportion of the crystalline phase. The X-ray diffraction pattern could be described with two-dimensional hexagonal unit cell [a=5.685(1) Å, symmetry group p6mm]. Structural modeling with a continuous electron density approach as well as with a discrete disordered atoms distribution was accomplished. The model was refined using the Rietveld method. The structure is characterized by a spiral arrangement of polymers (CF2-)n along the z-axis with complete mutual disordering by rotational displacement around z, as well as a partial molecular translation along the z-axis. Molecular disordering results in a systematic absence of reflections with 1≠0 and as a sequence in two-dimensional unit cell effect. The presence of complete rotational disordering distinguishes the ultra-dispersed form of polytetrafluoroethylene from the standard one (fluoroplast-4), where only partial disordering is observed.

Pr1+xBa2−xCu3O7±δ solid solution was investigated by means of X-ray powder diffraction and Rietveld analysis. Single-phase PrBa2Cu3O7±δ (Pr123) can be synthesized under a Pr-rich condition by sintering at 950 °C in air. The solubility of Pr1+xBa2−xCu3O7±δ solid solution is 0.08≤x≤0.80. The structure of Pr1+xBa2−xCu3O7±δ is orthorhombic for 0.08≤x<0.30, and transforms into tetragonal for 0.30≤x≤0.80. To form single-phase Pr123, the Ba sites in the Pr123 structure are partially occupied by excess Pr ions, and the smallest amount of excess Pr is x=0.08. Meanwhile, all Ba ions stay in the Ba sites.

The identification of crystallographic phases in the scanning electron microscope (SEM) has been limited by the lack of a simple way to obtain electron diffraction data of an unknown while observing the microstructure of the specimen. With the development of charge coupled device (CCD)-based detectors, backscattered electron Kikuchi patterns, alternately referred to as electron backscattered diffraction (EBSD) patterns, can be easily collected. Previously, EBSD has been limited to crystallographic orientation studies due to the poor pattern quality collected with video rate detector systems. With CCD detectors, a typical EBSD can now be acquired from a micron or submicron sized crystal using an exposure time of 1–10 s with an accelerating voltage of 10–40 kV and a beam current as low as 0.1 nA. Crystallographic phase analysis using EBSD is unique in that the properly equipped SEM permits high magnification images, EBSDs, and elemental information to be collected from bulk specimens. EBSD in the SEM has numerous advantages over other electron beam-based crystallographic techniques. The large angular view (∼70°) provided by EBSD and the ease of specimen preparation are distinct advantages of the technique. No sample preparation beyond what is commonly used for SEM specimens is required for EBSD.

The structure of two biomimetic copper complexes bis[4-benzylaldimino-3-methyl-1-phenyl-5-thio (seleno)pyrazolato]copper(II)—36 32N6X2Cu (where X=S, Se) have been studied and X-ray patterns of these compounds have been prepared using the Rietveld refinement technique. Both complexes crystallized in a monoclinic lattice, space group-C2/c(15). The unit-cell parameters are a=28.917(3) Å; b=7.000(2) Å; c=17.550(4) Å; β=106.869(1) (1) for C36H32CuN6S2 and a=29.126(6) Å; b=7.042(4) Å; c=17.228(2) Å; β=105.587(2) for C36H32CuN6Se2. Analysis of the copper and selenium K-edge X-ray absorption spectra (EXAFS) of these complexes show that a copper atom is in pseudo-tetrahedric ligand environment N2X2 with typical Cu–N bonds (R=2.00–2.01 Å) and significantly different Cu–S and Cu–Se bonds (R=2.27 Å and R=2.41 Å, respectively) because of different sulfur and selenium ion radii. © 2004 International Centre for Diffraction Data.

Weight fractions of four dominant phases (C3S, C2S, C4AF, and C3A) present in five industrial clinkers were estimated by a series of neutron and X-ray Rietveld refinements. Calculated powder patterns were derived from the structural data for monoclinic and triclinic C3S, monoclinic C2S, orthorhombic C4AF, cubic C3A and MgO. Neutron diffraction data were collected with the high resolution E9 diffractometer (BENSC) using two different wavelengths, X-ray diffraction data with a high resolution transmission diffractometer. Elemental composition of the samples obtained by ESEM/EDX technique were in a good agreement with the data delivered by the producers. Convergence of the refinements was remarkably different for X-ray and for neutron data. Several refinements were not completed due to numerical instabilities. Neutron refinements were found to be more stable than X-ray, but there was not any notable difference in the final estimated phases’ compositions. Calculated absolute deviates of phases’ weight fractions were mostly within ±10%, which for the less abundant phases corresponded to relative deviations within ±50%. © 2004 International Centre for Diffraction Data.

An overview of the techniques used in art and archaeology is presented and the applicability of X-ray radiography, X-ray fluorescence (XRF), and X-ray diffraction analysis (XRD) as a tool for nondestructive investigations of objects of art and archaeology is discussed. X-ray radiography, for example, is a standard technique widely used and accepted by art historians, archaeologists, curators, and conservators as this method enables information about the manufacturing process and the condition of an object without “touching” the artifact. XRF and XRD enable a nondestructive determination of the material composition of artifacts and the determination of the crystalline structure of the components too. Air path systems and instruments with the micro-beam of X-ray and synchrotron radiation were applied for the analysis of easel paintings, pigments in paint layers, glass artifacts, and coins.

Crystal structures of types II and III chlorothalonil, 2,4,5,6-tetrachloro-1,3-dicyanobenzene, (C8Cl4N2) were solved by applying Monte Carlo simulated annealing techniques to X-ray powder diffraction data and refined using the Rietveld method. Both types of chlorothalonil crystallize in monoclinic symmetry (space group P21 and two molecules per unit cell). Lattice parameters are: a=8.1615(18) Å, b=9.4191(19) Å, c=6.4728(14) Å, β=93.7307(64)° and V=497.8 Å3 for type II, and a=8.6003(10) Å, b=9.2382(11) Å, c=6.3024(7) Å, β=96.2152(60)° and V=498.5 Å3 for type III. The structures of both types of chlorothalonil are stacked by two coplanar molecular sheets paralleled to the b-axis. The adjacent two paralleled molecules in type II are on the same plane, while those in type III are on two different parallel planes.

The Lorenz-polarization (LP) factor, which is used for X-ray intensity calculations from polycrystalline materials, contains a term that describes the fraction of diffracting grains in the irradiated sample volume. We present extensions of this term and a series of experiments that tests its applicability. The implications of the analysis on microbeam diffraction are also discussed.

The crystal structure of La0.67Ca0.33Mn0.80Cu0.20O3 (LCMCO) compound was determined from laboratory X-ray powder diffraction data and refined by the Rietveld method. LCMCO is isostructural with La0.67Ca0.33MnO3 (LCMO). The crystal data are: La0.64Ca0.36Mn0.82Cu0.18O3.01, Mr=843.80, orthorhombic system, space group Pnma, a=5.4364(1) Å, b=7.6725(2) Å, c=5.4452(1) Å, V=227.124(8)Å3, Z=4, Dx=6.168 g∕cm3. In comparing with the Cu-free compound, subtle structural changes such as bond lengths and bond angles found in the Cu-doped compound may be responsible for the larger effects on the transport and magnetic properties when Cu partially substitutes for Mn in CMCO.

X-ray diffraction analysis on small samples or micro-area of large samples is always a challenge due to weak diffraction and poor statistics, especially when dealing with samples containing large grain size, inhomogeneous phase distribution, and preferred orientation. Two-dimensional X-ray diffraction has many advantages in microdiffraction analysis. A two-dimensional detector can collect a large amount of data both in terms of speed and angular coverage. This paper covers some aspects about instrumentation of two-dimensional X-ray diffraction and its applications in phase identification and stress analysis on small samples and micro-area of large samples.

Synchrotron X rays were used to perform nondestructive transmission diffraction and fluorescence experiments on a group of 24 European and Islamic astrolabes dated between 1350–1720 A.D. in order to determine their compositions. A group of six astrolabes produced in Lahore between 1601–1662 A.D. were found to contain a mixed α+β brass microstructure, proving that the brass was produced by a comelting technique rather than the traditional cementation process. The results also show evidence of dezincification, attributed to heavy annealing of the brass during astrolabe manufacture. This effect was so severe that an accurate analysis of the bulk Zn composition could not be determined from the fluorescence results alone; transmission X-ray diffraction gives a more accurate measurement of the bulk Zn composition.

Single crystals of gypsum were studied in a diffractometer equipped with a CCD two-dimensional detector. The microstructure of the crystal gave wide poorly shaped spots showing sometimes curved streaks around the spots, which made the integration process very difficult, yielding a low quality structure. The crystal structure and microstructure of gypsum has been studied by high-resolution synchrotron powder diffraction of a ground single crystal. The intensities in the synchrotron powder pattern can be reliably fitted although the peak shape displays anisotropic peak broadening. The Rietveld results for gypsum were a=6.522 91(3) Å, b=15.197 63(9) Å, c=6.522 91(3) Å, β=118.479(1)°, V=494.536(5) Å3 and Z=4 (s.g. I2/c) with RWP=5.39% and RF=1.64%. We have also studied the influence of the structural description used for gypsum in a synchrotron Rietveld quantitative phase analysis of a standard mixture containing 50 wt % of CaSO4⋅2H2O and Al2O3. Finally, the effects of the type of preferred orientation correction for laboratory X-ray powder data are also discussed. © 2004 International Centre for Diffraction Data.

XRF is generally considered a nondestructive analytical method in the sense that a specimen is not altered by the analytical procedure. This study is related to paintings and illuminated manuscripts, where the analytes are often inorganic pigments embedded into organic matrices such as fabrics (canvases), paper or parchment, binders, and varnish. We found that a typical measurement cycle with conventional tubes and energy dispersive systems (e.g., 100 s, 100 W tube-power) causes no visible harm. However, 3 kW radiative power for several minutes and more (as often required for wide angle scans as well as for the analysis of light elements or traces in a wavelength dispersive spectrometer) can leave visible traces of permanent yellowing, brittleness, and even mechanical decomposition. In such cases scanning electron microscopy-images indicate permanent alteration of the cellulose fibers and, in paper, of the binder. Employment of modern X-ray optical devices which focus the photons of a wide beam onto a small spot may also leave visible (and invisible) traces of destruction.

This study was performed to suggest convenient equations for quantifying Fe and K within the illite structure using relative intensities for the illite basal reflections. The 002/005 and 003/005 ratios were available for Fe and K quantifications, and equations could be derived as the following: CFe=(ln I002/005−1.807 ln I003/005+1.29)/(1.241 ln I003/005−3.843), CK=−(ln I002/005+0.121 ln I003/005−2.592)/(1.308 ln I003/005+1.984). The equations may obtain Fe and K contents within ca. ±0.05 atoms per half-unit cell, if incident radiation loss is minimized and basal reflection modification caused by expandable layers is eliminated. © 2004 International Centre for Diffraction Data.

Micro X-ray fluorescence (MXRF) offers the analyst a new approach to materials characterization. The range of applications is expanding rapidly. Single point analysis has been demonstrated for nanoliter volumes with detection limits at the 0.5 ng level. MXRF can be used as an element specific detector for capillary electrophoresis. Elemental imaging applications include analysis of sample corrosion and polymers, use as a combinatorial chemistry screening tool, and integration with molecular spectroscopic imaging methods to provide a more comprehensive characterization. Three-dimensional elemental imaging is a reality with the development of a confocal X-ray fluorescence microscope. Stereoview elemental X-ray imaging can provide unique views of materials that flat two-dimensional images cannot achieve. Spectral imaging offers chemical imaging capability, moving MXRF into a higher level of information content. The future is bright for MXRF as a materials characterization tool.

A new method, namely UACIEM, to extract reliable intensities of nonequivalent systematical overlapping reflections has been proposed and tested by simulated powder diffraction data from known crystal structures. Using both crystallographic and structural chemistry information, the method reconstructs diffraction intensities and solves a crystal structure through an iterative procedure. Our study shows that UACIEM is successful for cases where more than 30% of the total scattering power is located with precision from equivalent systematical overlapping reflections. The UACIEM process is not needed when equivalent systematical overlapping reflections are sufficient to reveal a crystal structure. UACIEM may fail in cases when: (i) only a small portion of the total scattering power (e.g., less than 7%) can be located, and (ii) most of the total scattering power (e.g., 95%) is located, but the atomic coordinates are not accurately known. The UACIEM method is superior to the simple equipartition methods for nonequivalent systematical overlapping reflections.