ZnSe-based heterostructures grown on GaAs substrates have been investigated for use in pin-diode LED applications. In this study, a conventional Bragg-Brentano diffractometer (BBD) has been used to screen samples for phase identification, crystallite size, presence of polycrystalline ZnSe, and initial rocking curve (RC) analysis. A limitation of the conventional diffractometer is that the smallest RC full width at half maximum (FWHM) that can be achieved is 500 to 600 arc sec. As deposition parameters are optimized and the RC limit of the conventional diffractometer is reached, analysis is moved to a four-bounce high-resolution diffractometer (HRD). Although more time for analysis is required, using the HRD has a RC resolution advantage, where RCs of <20 arc sec are obtained for neat GaAs wafers. Combining the BBD and HRD instruments for analysis of ZnSe films grown on GaAs substrates allows for an efficient means of high sample throughput combined with an accurate measurement of film alignment.

Activation energies for the intermixing reaction of textured metal-metal multilayer thin films have been determined using X-ray diffraction analysis. Kinetic data were collected utilizing an area detector so as to reduce intensity bias from changes in out-of-plane texture during the intermixing reaction. Activation energies for Al/Pt, Ni/Ti, and Co/Al metal-metal multilayer thin films have been determined as 95.4(2) kJ/mol, 201(13) kJ/mol, and 247(19) kJ/mol, respectively.

The microstructure evolution (crystallite size and microstrain) as well as the residual stress of Cu thin films of various thicknesses (250 nm, 500 nm, and 1 μm) on passivated Si substrates during isochronal annealing was investigated by in situ X-ray diffraction measurements in the temperature range between 25 °C and 250 °C. Before annealing, the thermoelastic behavior was investigated excluding the occurrence of thermally activated relaxation processes occurring above ambient temperature by in situ stress measurements below ambient temperature. On this basis, above ambient temperature, effects of stress relaxation and emerging secondary stresses (due to grain growth and annihilation of crystal defects, giving rise to a considerable tensile stress contribution development) could be identified for all three layers in the temperature regime between ambient temperature and 250 °C. Grain growth in the nanocrystalline thin films started at much lower temperatures as compared to coarse-grained materials. The results were discussed in terms of the effects of different driving forces and grain-boundary mobilities acting in nanocrystalline materials.

Synthetic analogs of naturally occurring nanoparticles have been studied by a range of X-ray techniques to determine their structure and chemistry, and relate these to their novel chemical properties and physical behavior. ZnS nanoparticles, formed in large concentrations naturally bymicrobial action, have an interesting core-shell structure with a highly distorted and strained outer layer. The strain propagates through the particles and produces unusual stiffness but can be relieved by changing the nature of the surface ligand binding. Weaker bound ligands allow high surface distortion, but strongly bound ligands relax this structure and reduce the overall strain. Only small amounts of ligand exchange causes transformations from the strained to the relaxed state. Most remarkably, minor point contacts between strained nanoparticles also relax the strain. Fe oxyhydroxide nanoparticles appear to go through structural transformations dependent on their size and formation conditions, and display a crystallographically oriented form of aggregation at the nanoscale that alters growth kinetics. At least one Fe oxyhydroxide mineral may only be stable on the nanoscale, and nonstoichiometry observed on the hematite surface suggests that for this phase and possibly other natural metal oxides, chemistry may be size dependent. Numerous questions exist on nanominerals formed in acid mine drainage sites and by reactions at interfaces.

The biaxial stress and thermal expansion of multilayer doped-aluminosilicate environmental barrier coatings were measured in situ during cooling using microfocused high-energy X-rays in transmission. Coating stresses during cooling from 1000 °C were measured for as-sprayed and thermally cycled samples. In the as-sprayed state, tensile stresses as high as 75 MPa were measured in the doped-aluminosilicate topcoat at 375 °C, after which a drop in the stress occurred accompanied by through-thickness cracking of the two outermost layers. After thermally cycling the samples, the stress in the topcoat was reduced to approximately 50 MPa, and there was no drop in stress upon cooling. This stress reduction was attributed to a crystallographic phase transformation of the topcoat and the accompanying change in thermal expansion coefficient. The addition of a doped aluminosilicate to the mullite layer did not lower the stress in the topcoat, but may offer increased durability due to an increased compressive stress.

Differences between up-cut and down-cut grinding are usually not considered since both modes are alternating during conventional face grinding. Nevertheless, there is a pronounced distinction in the fashion of material removal which could lead to unequal states of surface residual stress. By means of X-ray diffraction analysis, ground plates made from three types of steel were investigated in order to compute and compare both macroscopic and microscopic residual stress and domains of coherent scattering. With respect to the main sources of residual stress generation, i.e., plastic and thermal deformation, machining process was carried out in two types of cooling environment. The results indicate significant influence of heat removal since differences between the two grinding modes are virtually nonexistent for liquid cooling, whereas dry grinding results in higher compressive normal residual stresses for down-cut mode in comparison to the up cut.

Verification of materials is an increasingly important need in pharmaceutical distribution. XStream Systems, Inc. has developed an energy dispersive X-ray diffraction (EDXRD) system which can quickly verify crystalline pharmaceuticals in the distribution cycle. Materials may be in solid or powder form and the technique is nondestructive. Unlike angular X-ray diffraction (AXRD), a “white” X-ray beam between 20 and 80 keV is used. This energetic beam can penetrate through relatively thick materials, diffracting from crystallites within the samples. Materials can be observed even when they are located within opaque, sealed containers. That is, for most cases the drugs can be examined in their sealed, packaged vials without any sample preparation. The tabletop unit uses a confocal geometry to maximize the X-ray intensity from a relatively low-powered, air-cooled X-ray source. The beam is collimated by a circular slit assembly before the sample. A similar slit assembly after the sample collimates the diffracted beam. A single, state-of-the-art, CdTe solid-state detector with a multichannel analyzer is used to process the diffracted signal. This collimation system interrogates a doughnut-shaped volume within the sample under test. One of the design goals was to develop a unit that is capable of performing quick verification or detection of complex materials and mixtures at a number of points along the distribution paths yet can be operated by personnel with minimal scientific knowledge. Rapid identification of unknowns is possible using neural network search algorithms or pattern matching techniques. The Material Recognition Software Engine (MRSE) utilizes a localized SQL database to store and process the raw spectra data. The MRSE takes the sample data and determines if it matches any known patterns within its database. This engine has demonstrated that it can verify a number of drugs within 30 s with better than 97% accuracy.

The two-dimensional XRD (GADDS) was used to characterize the microstructure of an applied self-leveling compound (SLC). A calcium aluminate cement based SLC was prepared on two different substrates (water absorbent and nonwater absorbent) to determine the vertical distribution of the crystalline phases. The application of the GADDS enables the detection of the phase composition of the hydrating mortar in horizontal slices. Thus the analysis could be carried out in position-sensitive mode at three different areas: near the bottom, in the center, and at the top of the mortar. For investigation of SLCs from the very early hydration stage up to 10 h of hydration, a custom-made in situ sample holder for the measurements was designed and constructed. The combination of the GADDS and the custom-made in situ sample holder provides the possibility to characterize additionally the time-dependent phase composition within the SLC. The nonabsorbent substrate has no effect on the hydration of the binder phases but the absorbent substrate influences the formation of ettringite. In the top layer of the SLC the ettringite content is reduced during the first hours of hydration. The absorbing forces of the substrate lead to migration of the mix water to the substrate. This lack of water results in the reduced formation of ettringite.

Investigation into the early hydration of Portland cement was performed by in situ X-ray diffraction (XRD). Technical white cement was used for the XRD analysis on a D5000 diffractometer (Siemens). All diffraction patterns of the in situ measurement which were recorded up to 22 h of hydration at defined temperatures were analyzed by Rietveld refinement. The resulting phase composition was transformed with respect to free water and C-S-H leading to the total composition of the cement paste. The hydration reactions can be observed by dissolution of clinker phases as well as by the formation of the hydrate phases ettringite and portlandite. With increasing temperatures the reactions proceed faster. The formation of ettringite is directly influenced by the rate of dissolution of anhydrite and tricalcium aluminate (C3A). The beginning of the main period of hydration is marked by the start of portlandite formation. The experiments point out that a quantitative phase analysis of the cement hydration is feasible with standard laboratory diffractometers.

X-ray fluorescence spectrometry (XRF) and micro-X-ray diffraction (μXRD) were used to analyze the composition of pigments on a pastel drawing, Special No. 32, by Georgia O’Keeffe. XRF analyses showed that, among other pigments present in the drawing, the red, orange, and yellow pigments may possibly be identified with lead- and chromium-based pigments: lead chromates, red and yellow lead oxides, and/or lead carbonates, plus calcium-based pastel fillers, such as whiting or gypsum. XRD examination of a sample removed from a dark mottled area of coral red pastel confirmed that this pigment layer, which is associated with a darkened appearance and high Pb:Cr ratios, matches the red lead oxide, minium (2PbO⋅PbO2).

To establish standard working practices and further understanding of the application of X-ray fluorescence (XRF) spectroscopy to works of art and cultural heritage materials, a series of round-robin tests have been conducted biannually since 2002. In 2008 the round-robin explored the application of XRF to the study of paintings on canvas. Thirteen samples, consisting of both modern and traditional pigments on canvas, were distributed to 25 participating institutions for analysis. The samples were designed to explore common challenges encountered in the XRF analysis of painted works including peak overlaps, sum peaks, layering/shielding effects, detection of low-Z pigments, and modern pigments. The results from representative samples highlighting each topic are discussed.

Sauropod dinosaurs were typically one magnitude larger than any other living or extinct terrestrial animal. This sheer size of the sauropod leads to scale effects in their biology and physiology that still are inadequately understood. The only remnants of the sauropods are their fossilized bones. These fossilized bones have sustained burial for some hundred million years and thus may have experienced significant diagenetic changes. These diagenetic changes often do not affect bone preservation on the histological level, but may lead to significant alterations of the bone microstructure. Here the influence of diagenesis on the microstructure of fossilized sauropod bones using femur cross section of Brachiosaurus brancai that was excavated in the Tendaguru beds in Tanzania is investigated. The element distribution in this dinosaur bone is studied by a combination of micro-X-ray-fluorescence (μ-XRF) using synchrotron radiation and energy dispersive X-ray analyses (EDX) in the scanning electron microscope. These techniques reveal quantitative values of the element concentration at a macroscopic level combined with qualitative information at high spatial resolution of the distribution of Ca, Co, Cr, V, Pb, U, Sr, Y, and As in the fossil bones. This allows a differentiation between the remnants of the original bone apatite and pore filling minerals and also a visualization of damage, e.g., cracks introduced by diagenetic processes.

We have developed a convenient and effective XRF analysis procedure for trace amount of K, Ca, V, Mn, Fe, Ni, Cu, Zn, Cd, and Pb in environmental waters by using a preconcentration using the natural polymer (agar). The thin agar film was prepared by drying a homogeneous agar gel after mixing the aqueous sample solution with the agar powder. XRF analysis of the preconcentrated thin agar films containing trace metals showed a good repeatability because agar films were homogeneous enough. SB (signal to noise) ratios of the XRF intensity of the analytes were improved drastically. The linear calibration curves of K, Ca, V, Mn, Fe, Ni, Cu, Zn, Cd, and Pb showed a good linearity within the calibration ranges. The lower limits of detection (LLD) were 1.4 μg/mL for K, 0.26 μg/mL for Ca, 0.088 μg/mL for V, 0.029 μg/mL for Mn, 0.11 μg/mL for Fe, 0.016 μg/mL for Ni, 0.030 μg/mL for Cu, 0.017 μg/mL for Zn, 0.20 μg/mL for Cd, and 0.066 μg/mL for Pb, respectively. The proposed preconcentration method was applied to several environmental water samples.

Total reflection X-ray fluorescence analysis (TXRF) is a method for qualitative and quantitative analysis of trace elements. In general TXRF is known to allow for linear calibration typically using an internal standard for quantification. For small sample amounts (low ng region) the thin film approximation is valid neglecting absorption effects of the exciting and the detected radiation. However, for higher total amounts of samples deviations from the linear relation between fluorescence intensity and sample amount have been observed. The topic of the presented work is an investigation of the parameters influencing the absorption phenomenon. Samples with different total amounts of arsenic have been prepared to determine the upper limit of sample mass where the linear relation between fluorescence intensity and sample amount is no longer guaranteed. It was found that the relation between fluorescence intensity and sample amount is linear up to ∼100 ng arsenic. A simulation model was developed to calculate the influence of the absorption effects. Even though the results of the simulations are not satisfying yet it could be shown that one of the key parameters for the absorption effect is the density of the investigated element in the dried residues.