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Table of Contents - Volume 15 - Issue 03

Front Cover (OFC, IFC) and matter

MAM volume 15 issue 3 Cover and Front matter

Microscopy and Microanalysis, Volume 15, Issue 03, June 2009, pp f1-f8

doi:10.1017/S1431927609090746 (About doi), Published Online by Cambridge University Press 22 May 2009

Back Cover (IBC, OBC) and matter

MAM volume 15 issue 3 Cover and Back matter

Microscopy and Microanalysis, Volume 15, Issue 03, June 2009, pp b1-b1

doi:10.1017/S1431927609090758 (About doi), Published Online by Cambridge University Press 22 May 2009

Biological Applications

Nanogold as a Specific Marker for Electron Cryotomography

Yongning He, Grant J. Jensen and Pamela J. Bjorkman

Microscopy and Microanalysis, Volume 15, Issue 03, June 2009, pp 183-188

doi:10.1017/S1431927609090424 (About doi), Published Online by Cambridge University Press 22 May 2009

A Comparison of Macroscopic and Microscopic Hair Color Measurements and a Quantification of the Relationship between Hair Color and Thickness

Michelle R. Vaughn, Elizabeth Brooks, Roland A.H. van Oorschot and Swati Baindur-Hudson

Microscopy and Microanalysis, Volume 15, Issue 03, June 2009, pp 189-193

doi:10.1017/S1431927609090357 (About doi), Published Online by Cambridge University Press 22 May 2009

A Unique Vascular Configuration among the Efferent Branchial Arteries and Splanchnic Arteries in the Yellow Stingray, Urobatis jamaicensis

Bethany L. Basten, Robin L. Sherman, Alois Lametschwandtner and Richard E. Spieler

Microscopy and Microanalysis, Volume 15, Issue 03, June 2009, pp 194-196

doi:10.1017/S1431927609090369 (About doi), Published Online by Cambridge University Press 22 May 2009

Optimizing Electron Backscatter Diffraction of Carbonate Biominerals—Resin Type and Carbon Coating

Alberto Pérez-Huerta and Maggie Cusack

Microscopy and Microanalysis, Volume 15, Issue 03, June 2009, pp 197-203

doi:10.1017/S1431927609090370 (About doi), Published Online by Cambridge University Press 22 May 2009

Materials Applications

The Applications of In Situ Electron Energy Loss Spectroscopy to the Study of Electron Beam Nanofabrication

Shiahn J. Chen, David G. Howitt, Brian C. Gierhart, Rosemary L. Smith and Scott D. Collins

Microscopy and Microanalysis, Volume 15, Issue 03, June 2009, pp 204-212

doi:10.1017/S1431927609090345 (About doi), Published Online by Cambridge University Press 22 May 2009

Mn Valency at La0.7Sr0.3MnO3/SrTiO3 (0 0 1) Thin Film Interfaces

Thomas Riedl, Thomas Gemming, Kathrin Dörr, Martina Luysberg and Klaus Wetzig

Microscopy and Microanalysis, Volume 15, Issue 03, June 2009, pp 213-221

doi:10.1017/S1431927609090229 (About doi), Published Online by Cambridge University Press 22 May 2009

Quantitative Cathodoluminescence Mapping with Application to a Kalgoorlie Scheelite

Colin M. MacRae, Nicholas C. Wilson and Joel Brugger

Microscopy and Microanalysis, Volume 15, Issue 03, June 2009, pp 222-230

doi:10.1017/S1431927609090308 (About doi), Published Online by Cambridge University Press 22 May 2009

Evaluation of Controlled-Drift Detectors in X-Ray Spectroscopic Imaging Applications

Andrea Castoldi, Chiara Guazzoni, Cigdem Ozkan, Giorgio Vedani, Robert Hartmann and Aniouar Bjeoumikhov

Microscopy and Microanalysis, Volume 15, Issue 03, June 2009, pp 231-236

doi:10.1017/S1431927609090291 (About doi), Published Online by Cambridge University Press 22 May 2009

The Effect of Oxide Overlayers on Secondary Electron Dopant Mapping

Maurizio Dapor, Mark A.E. Jepson, Beverley J. Inkson and Cornelia Rodenburg

Microscopy and Microanalysis, Volume 15, Issue 03, June 2009, pp 237-243

doi:10.1017/S1431927609090400 (About doi), Published Online by Cambridge University Press 22 May 2009

Three-Dimensional Measurement of Line Edge Roughness in Copper Wires Using Electron Tomography

Peter Ercius, Lynne M. Gignac, C.-K. Hu and David A. Muller

Microscopy and Microanalysis, Volume 15, Issue 03, June 2009, pp 244-250

doi:10.1017/S143192760909028X (About doi), Published Online by Cambridge University Press 22 May 2009

High-Angle Annular Dark Field Scanning Transmission Electron Microscopy on Carbon-Based Functional Polymer Systems

Erwan Sourty, Svetlana van Bavel, Kangbo Lu, Ralph Guerra, Georg Bar and Joachim Loos

Microscopy and Microanalysis, Volume 15, Issue 03, June 2009, pp 251-258

doi:10.1017/S1431927609090278 (About doi), Published Online by Cambridge University Press 22 May 2009

Atomic Force Microscopy

Modeling Rectangular Cantilevers during Torsion and Deflection for Application to Frictional Force Microscopy

Victor C. Hayden and Luc Y. Beaulieu

Microscopy and Microanalysis, Volume 15, Issue 03, June 2009, pp 259-264

doi:10.1017/S1431927609090382 (About doi), Published Online by Cambridge University Press 22 May 2009

Book Review

Polymer Microscopy. Third Edition. L.C. Sawyer, D.T. Grubb, and G.F. Meyers. Springer, New York; 2008, 540 pages. ISBN 978-0-387-72627-4

Yuhong Wu

Microscopy and Microanalysis, Volume 15, Issue 03, June 2009, pp 265-265

doi:10.1017/S1431927609090692 (About doi), Published Online by Cambridge University Press 22 May 2009

Calendar

Calendar of Meetings and Courses

Microscopy and Microanalysis, Volume 15, Issue 03, June 2009, pp 266-270

doi:10.1017/S1431927609090333 (About doi), Published Online by Cambridge University Press 22 May 2009

Mn Valency at La_0.7Sr_0.3MnO₃/SrTiO₃ (0 0 1) Thin Film Interfaces