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  • Note: Abstract, PDF and HTML open in a new window

  • Editor(s):
  • Robert L. Price, University of South Carolina, USA

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Table of Contents - Volume 15 - Issue 01  

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Editorial

 
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Editorial: Microscopy and Microanalysis—A Brief History and Moving Forward

Robert L. Price

Microscopy and Microanalysis, Volume 15, Issue 01, February 2009, pp 1-1
doi:10.1017/S1431927609090102 (About doi), Published Online by Cambridge University Press 15 Jan 2009
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Biological Applications

 
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Imaging the Zona Pellucida of Canine and Feline Oocytes Using Scanning Electron Microscopy

Matthew O. Lunn and Shirley J. Wright

Microscopy and Microanalysis, Volume 15, Issue 01, February 2009, pp 2-14
doi:10.1017/S1431927609090084 (About doi), Published Online by Cambridge University Press 15 Jan 2009
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Materials Specimen Preparation

 
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Fast and Simple Specimen Preparation for TEM Studies of Oxide Films Deposited on Silicon Wafers

Valentin S. Teodorescu and Marie-Genevieve Blanchin

Microscopy and Microanalysis, Volume 15, Issue 01, February 2009, pp 15-19
doi:10.1017/S1431927609090011 (About doi), Published Online by Cambridge University Press 15 Jan 2009
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Materials Applications

 
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Electron Diffraction Based Analysis of Phase Fractions and Texture in Nanocrystalline Thin Films, Part II: Implementation

János L. Lábár

Microscopy and Microanalysis, Volume 15, Issue 01, February 2009, pp 20-29
doi:10.1017/S1431927609090023 (About doi), Published Online by Cambridge University Press 15 Jan 2009
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Microstructural and Compositional Analysis of Strontium-Doped Lead Zirconate Titanate Thin Films on Gold-Coated Silicon Substrates

S. Sriram, M. Bhaskaran, D.R.G. Mitchell, K.T. Short, A.S. Holland and A. Mitchell

Microscopy and Microanalysis, Volume 15, Issue 01, February 2009, pp 30-35
doi:10.1017/S1431927609090072 (About doi), Published Online by Cambridge University Press 15 Jan 2009
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Characterization of Al and Mg Alloys from Their X-Ray Emission Bands

Philippe Jonnard, Karine Le Guen, Raynald Gauvin and Jean-François Le Berre

Microscopy and Microanalysis, Volume 15, Issue 01, February 2009, pp 36-45
doi:10.1017/S1431927609090060 (About doi), Published Online by Cambridge University Press 15 Jan 2009
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Structural and Chemical Characterization of Yb2O3-ZrO2 System by HAADF-STEM and HRTEM

C. Angeles-Chavez, P. Salas, L.A. Díaz-Torres, E. de la Rosa, R. Esparza and R. Perez

Microscopy and Microanalysis, Volume 15, Issue 01, February 2009, pp 46-53
doi:10.1017/S1431927609090047 (About doi), Published Online by Cambridge University Press 15 Jan 2009
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Reactive Multilayers Examined by HRTEM and Plasmon EELS Chemical Mapping

M.A. Mat Yajid and G. Möbus

Microscopy and Microanalysis, Volume 15, Issue 01, February 2009, pp 54-61
doi:10.1017/S1431927609090035 (About doi), Published Online by Cambridge University Press 15 Jan 2009
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Microstructure of Surface and Subsurface Layers of a Ni-Ti Shape Memory Microwire

H. Tian, D. Schryvers, S. Shabalovskaya and J. Van Humbeeck

Microscopy and Microanalysis, Volume 15, Issue 01, February 2009, pp 62-70
doi:10.1017/S1431927609090059 (About doi), Published Online by Cambridge University Press 15 Jan 2009
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Three-Dimensional Analysis of Solid Oxide Fuel Cell Ni-YSZ Anode Interconnectivity

James R. Wilson, Marcio Gameiro, Konstantin Mischaikow, William Kalies, Peter W. Voorhees and Scott A. Barnett

Microscopy and Microanalysis, Volume 15, Issue 01, February 2009, pp 71-77
doi:10.1017/S1431927609090096 (About doi), Published Online by Cambridge University Press 15 Jan 2009
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Calendar

 
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Calendar of Meetings and Courses

Microscopy and Microanalysis, Volume 15, Issue 01, February 2009, pp 78-82
doi:10.1017/S143192760909014X (About doi), Published Online by Cambridge University Press 15 Jan 2009
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