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  • Editor(s):
  • Robert L. Price, University of South Carolina, USA

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Table of Contents - Volume 14 - Issue 01 (Special Issue: Materials Research in an Aberration-Free Environment)  

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INTRODUCTION

 
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Introduction: Materials Research in an Aberration-Free Environment

David J. Smith

Microscopy and Microanalysis, Volume 14, Issue 01, February 2008, pp 1-1
doi:10.1017/S1431927608080100 (About doi), Published Online by Cambridge University Press 18 Jan 2008
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REVIEW

 
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Development of Aberration-Corrected Electron Microscopy

David J. Smith

Microscopy and Microanalysis, Volume 14, Issue 01, February 2008, pp 2-15
doi:10.1017/S1431927608080124 (About doi), Published Online by Cambridge University Press 03 Jan 2008
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Research Articles

 
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Contrast Transfer and Resolution Limits for Sub-Angstrom High-Resolution Transmission Electron Microscopy

Markus Lentzen

Microscopy and Microanalysis, Volume 14, Issue 01, February 2008, pp 16-26
doi:10.1017/S1431927608080045 (About doi), Published Online by Cambridge University Press 21 Dec 2007
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A Practical Solution for Eliminating Artificial Image Contrast in Aberration-Corrected TEM

Jun Yamasaki, Tomoyuki Kawai, Yushi Kondo and Nobuo Tanaka

Microscopy and Microanalysis, Volume 14, Issue 01, February 2008, pp 27-35
doi:10.1017/S1431927608080173 (About doi), Published Online by Cambridge University Press 04 Jan 2008
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Spatial Resolution and Information Transfer in Scanning Transmission Electron Microscopy

Yiping Peng, Mark P. Oxley, Andrew R. Lupini, Matthew F. Chisholm and Stephen J. Pennycook

Microscopy and Microanalysis, Volume 14, Issue 01, February 2008, pp 36-47
doi:10.1017/S1431927608080161 (About doi), Published Online by Cambridge University Press 03 Jan 2008
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Modeling Atomic-Resolution Scanning Transmission Electron Microscopy Images

Scott D. Findlay, Mark P. Oxley and Leslie J. Allen

Microscopy and Microanalysis, Volume 14, Issue 01, February 2008, pp 48-59
doi:10.1017/S1431927608080112 (About doi), Published Online by Cambridge University Press 21 Dec 2007
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High-Resolution TEM and the Application of Direct and Indirect Aberration Correction

Crispin J.D. Hetherington, Lan-Yun Shery Chang, Sarah Haigh, Peter D. Nellist, Lionel Cervera Gontard, Rafal E. Dunin-Borkowski and Angus I. Kirkland

Microscopy and Microanalysis, Volume 14, Issue 01, February 2008, pp 60-67
doi:10.1017/S1431927608080148 (About doi), Published Online by Cambridge University Press 03 Jan 2008
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Electron Holography with a Cs-Corrected Transmission Electron Microscope

Dorin Geiger, Hannes Lichte, Martin Linck and Michael Lehmann

Microscopy and Microanalysis, Volume 14, Issue 01, February 2008, pp 68-81
doi:10.1017/S143192760808001X (About doi), Published Online by Cambridge University Press 21 Dec 2007
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Imaging Modes for Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

P.D. Nellist, E.C. Cosgriff, G. Behan and A.I. Kirkland

Microscopy and Microanalysis, Volume 14, Issue 01, February 2008, pp 82-88
doi:10.1017/S1431927608080057 (About doi), Published Online by Cambridge University Press 21 Dec 2007
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Motion of Gold Atoms on Carbon in the Aberration-Corrected STEM

Philip E. Batson

Microscopy and Microanalysis, Volume 14, Issue 01, February 2008, pp 89-97
doi:10.1017/S1431927608080197 (About doi), Published Online by Cambridge University Press 21 Dec 2007
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Aberration-Corrected STEM Imaging of Ag on [gamma]-Al2O3

Douglas A. Blom, Lawrence F. Allard, Chaitanya K. Narula and Melanie J. Moses-DeBusk

Microscopy and Microanalysis, Volume 14, Issue 01, February 2008, pp 98-103
doi:10.1017/S143192760808015X (About doi), Published Online by Cambridge University Press 21 Dec 2007
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Atomic-Resolution STEM in the Aberration-Corrected JEOL JEM2200FS

Robert F. Klie, Craig Johnson and Yimei Zhu

Microscopy and Microanalysis, Volume 14, Issue 01, February 2008, pp 104-112
doi:10.1017/S1431927608080136 (About doi), Published Online by Cambridge University Press 03 Jan 2008
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CALENDAR

 
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Calendar of Meetings and Courses

Microscopy and Microanalysis, Volume 14, Issue 01, February 2008, pp 113-116
doi:10.1017/S1431927608080082 (About doi), Published Online by Cambridge University Press 18 Jan 2008
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