Microscopy and Microanalysis Vol. 11 Issue 05

Microscopy and Microanalysis

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Table of Contents - Volume 11 - Issue 05 - 2005

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Special Issue: Frontiers of Electron Microscopy in Materials Science

Introduction: Frontiers of Electron Microscopy in Materials Science Introduction: Frontiers of Electron Microscopy in Materials Science

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Wayne King

Microscopy and Microanalysis / Volume 11 / Issue 05 / October 2005, pp 377 - 377

2005 microscopy society of america

DOI: http://dx.doi.org/10.1017/S1431927605050725 (About DOI), Published online: 28 September 2005

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Recent Advances in Electron Tomography: TEM and HAADF-STEM Tomography for Materials Science and Semiconductor Applications Recent Advances in Electron Tomography: TEM and HAADF-STEM Tomography for Materials Science and Semiconductor Applications

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Christian Kübel, Andreas Voigt, Remco Schoenmakers, Max Otten, David Su, Tan-Chen Lee, Anna Carlsson and John Bradley

Microscopy and Microanalysis / Volume 11 / Issue 05 / October 2005, pp 378 - 400

2005 microscopy society of america

DOI: http://dx.doi.org/10.1017/S1431927605050361 (About DOI), Published online: 26 September 2005

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Structure Determination of Atomically Controlled Crystal Architectures Grown within Single Wall Carbon Nanotubes Structure Determination of Atomically Controlled Crystal Architectures Grown within Single Wall Carbon Nanotubes

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Angus I. Kirkland, Rüdiger R. Meyer, J. Sloan and J.L. Hutchison

Microscopy and Microanalysis / Volume 11 / Issue 05 / October 2005, pp 401 - 409

2005 microscopy society of america

DOI: http://dx.doi.org/10.1017/S1431927605050385 (About DOI), Published online: 28 September 2005

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TEM Investigation of Nanophase Aluminum Powder TEM Investigation of Nanophase Aluminum Powder

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Valéry Y. Gertsman and Queenie S.M. Kwok

Microscopy and Microanalysis / Volume 11 / Issue 05 / October 2005, pp 410 - 420

her majesty the queen in right of canada, as represented by the minister of natural resources, 2005

DOI: http://dx.doi.org/10.1017/S1431927605050336 (About DOI), Published online: 28 September 2005

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LaI₂@(18,3)SWNT: The Unprecedented Structure of a LaI₂ “Crystal,” Encapsulated within a Single-Walled Carbon Nanotube LaI₂@(18,3)SWNT: The Unprecedented Structure of a LaI₂ “Crystal,” Encapsulated within a Single-Walled Carbon Nanotube

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Steffi Friedrichs, Angus I. Kirkland, Rüdiger R. Meyer, Jeremy Sloan and Malcolm L.H. Green

Microscopy and Microanalysis / Volume 11 / Issue 05 / October 2005, pp 421 - 430

2005 microscopy society of america

DOI: http://dx.doi.org/10.1017/S1431927605050324 (About DOI), Published online: 28 September 2005

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Searching Ultimate Nanometrology for AlOx Thickness in Magnetic Tunnel Junction by Analytical Electron Microscopy and X-ray Reflectometry Searching Ultimate Nanometrology for AlOx Thickness in Magnetic Tunnel Junction by Analytical Electron Microscopy and X-ray Reflectometry

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Se Ahn Song, Tatsumi Hirano, Jong Bong Park, Kazutoshi Kaji, Ki Hong Kim and Shohei Terada

Microscopy and Microanalysis / Volume 11 / Issue 05 / October 2005, pp 431 - 445

2005 microscopy society of america

DOI: http://dx.doi.org/10.1017/S1431927605050580 (About DOI), Published online: 28 September 2005

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Damage in III–V Compounds during Focused Ion Beam Milling Damage in III–V Compounds during Focused Ion Beam Milling

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S. Rubanov and P.R. Munroe

Microscopy and Microanalysis / Volume 11 / Issue 05 / October 2005, pp 446 - 455

2005 microscopy society of america

DOI: http://dx.doi.org/10.1017/S1431927605050294 (About DOI), Published online: 04 March 2005

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Self-Assembled Nanostructures on VSe₂ Surfaces Induced by Cu Deposition Self-Assembled Nanostructures on VSe₂ Surfaces Induced by Cu Deposition

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Erdmann Spiecker, Stefan Hollensteiner, Wolfgang Jäger, Hans Haselier and Herbert Schroeder

Microscopy and Microanalysis / Volume 11 / Issue 05 / October 2005, pp 456 - 471

2005 microscopy society of america

DOI: http://dx.doi.org/10.1017/S1431927605050373 (About DOI), Published online: 28 September 2005

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Book Review

diFiore's Atlas of Histology with Functional Correlations Victor P. Eroschenko diFiore's Atlas of Histology with Functional Correlations Victor P. Eroschenko

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Christian T. K.-H. Stadtländer

Microscopy and Microanalysis / Volume 11 / Issue 05 / October 2005, pp 472 - 472

2005 microscopy society of america

DOI: http://dx.doi.org/10.1017/S1431927605000735 (About DOI), Published online: 28 September 2005

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CALENDAR

Calendar of Meetings and Courses Calendar of Meetings and Courses

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Microscopy and Microanalysis / Volume 11 / Issue 05 / October 2005, pp 473 - 477

2005 microscopy society of america

DOI: http://dx.doi.org/10.1017/S1431927605050671 (About DOI), Published online: 28 September 2005

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Erratum

Erratum Erratum

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Uri Admon, David Donohue, Helmut Aigner, Gabriele Tamborini, Olivier Bildstein and Maria Betti

Microscopy and Microanalysis / Volume 11 / Issue 05 / October 2005, pp 477 - 477

2005 microscopy society of america

DOI: http://dx.doi.org/10.1017/S1431927605050749 (About DOI), Published online: 28 September 2005

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