Microscopy and Microanalysis Vol. null Issue 04

Microscopy and Microanalysis

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Table of Contents - Volume - Issue 04 - 2004

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Letter to the Editor

Letter to the Editor: Image Formation in the High-Resolution Transmission Electron Microscope Letter to the Editor: Image Formation in the High-Resolution Transmission Electron Microscope

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Michael A. O'Keefe

Microscopy and Microanalysis / Volume / Issue 04 / August 2004, pp 397 - 399

2004 Microscopy Society of America

DOI: http://dx.doi.org/10.1017/S1431927604211059 (About DOI), Published online: 01 August 2004

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Authors' Response Authors' Response

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A.C. Diebold, B. Foran, C. Kisielowski, D.A. Muller, S.J. Pennycook, E. Principe and S. Stemmer

Microscopy and Microanalysis / Volume / Issue 04 / August 2004, pp 399 - 400

2004 Microscopy Society of America

DOI: http://dx.doi.org/10.1017/S1431927604221055 (About DOI), Published online: 01 August 2004

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Review Paper

“Indirect” High-Resolution Transmission Electron Microscopy: Aberration Measurement and Wavefunction Reconstruction “Indirect” High-Resolution Transmission Electron Microscopy: Aberration Measurement and Wavefunction Reconstruction

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Angus I. Kirkland and Rüdiger R. Meyer

Microscopy and Microanalysis / Volume / Issue 04 / August 2004, pp 401 - 413

2004 Microscopy Society of America

DOI: http://dx.doi.org/10.1017/S1431927604040437 (About DOI), Published online: 01 August 2004

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Instrumentation and Techniques

Some Chicago Aberrations Some Chicago Aberrations

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A.V. Crewe

Microscopy and Microanalysis / Volume / Issue 04 / August 2004, pp 414 - 419

2004 Microscopy Society of America

DOI: http://dx.doi.org/10.1017/S1431927604040085 (About DOI), Published online: 01 August 2004

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Carbon Nanotube Electrostatic Biprism: Principle of Operation and Proof of Concept Carbon Nanotube Electrostatic Biprism: Principle of Operation and Proof of Concept

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John Cumings, A. Zettl and M.R. McCartney

Microscopy and Microanalysis / Volume / Issue 04 / August 2004, pp 420 - 424

2004 Microscopy Society of America

DOI: http://dx.doi.org/10.1017/S1431927604040759 (About DOI), Published online: 01 August 2004

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Determination and Correction of Position Detection Nonlinearity in Single Particle Tracking and Three-Dimensional Scanning Probe Microscopy Determination and Correction of Position Detection Nonlinearity in Single Particle Tracking and Three-Dimensional Scanning Probe Microscopy

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Christian Tischer, Arnd Pralle and Ernst-Ludwig Florin

Microscopy and Microanalysis / Volume / Issue 04 / August 2004, pp 425 - 434

2004 Microscopy Society of America

DOI: http://dx.doi.org/10.1017/S1431927604040140 (About DOI), Published online: 01 August 2004

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Plasmon-Ratio Imaging: A Technique for Enhancing the Contrast of Second Phases with Reduced Diffraction Contrast in TEM Micrographs Plasmon-Ratio Imaging: A Technique for Enhancing the Contrast of Second Phases with Reduced Diffraction Contrast in TEM Micrographs

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Graham J.C. Carpenter

Microscopy and Microanalysis / Volume / Issue 04 / August 2004, pp 435 - 441

2004 Microscopy Society of America

DOI: http://dx.doi.org/10.1017/S1431927604040772 (About DOI), Published online: 01 August 2004

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Biological Applications

Detection of Mitochondrial Caspase Activity in Real Time In Situ in Live Cells Detection of Mitochondrial Caspase Activity in Real Time In Situ in Live Cells

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Yingpei Zhang, Catherine Haskins, Marisa Lopez-Cruzan, Jianhua Zhang, Victoria E. Centonze and Brian Herman

Microscopy and Microanalysis / Volume / Issue 04 / August 2004, pp 442 - 448

2004 Microscopy Society of America

DOI: http://dx.doi.org/10.1017/S1431927604040401 (About DOI), Published online: 01 August 2004

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Cytochemical Labeling for Fungal and Host Components in Plant Tissues Inoculated with Fungal Wilt Pathogens Cytochemical Labeling for Fungal and Host Components in Plant Tissues Inoculated with Fungal Wilt Pathogens

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G.B. Ouellette, R.P. Baayen, H. Chamberland, M. Simard, D. Rioux and P.M. Charest

Microscopy and Microanalysis / Volume / Issue 04 / August 2004, pp 449 - 461

2004 Microscopy Society of America

DOI: http://dx.doi.org/10.1017/S1431927604040796 (About DOI), Published online: 01 August 2004

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Materials Applications

Mapping of Process-Induced Dopant Redistributions by Electron Holography Mapping of Process-Induced Dopant Redistributions by Electron Holography

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Wolf-Dieter Rau and Alexander Orchowski

Microscopy and Microanalysis / Volume / Issue 04 / August 2004, pp 462 - 469

2004 Microscopy Society of America

DOI: http://dx.doi.org/10.1017/S1431927604040036 (About DOI), Published online: 01 August 2004

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Analyses of Eutectoid Phase Transformations in Nb–Silicide In Situ Composites Analyses of Eutectoid Phase Transformations in Nb–Silicide In Situ Composites

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B.P. Bewlay, S.D. Sitzman, L.N. Brewer and M.R. Jackson

Microscopy and Microanalysis / Volume / Issue 04 / August 2004, pp 470 - 480

2004 Microscopy Society of America

DOI: http://dx.doi.org/10.1017/S1431927604040760 (About DOI), Published online: 01 August 2004

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Microanalysis

Measurement of X-ray Emission Efficiency for K-lines Measurement of X-ray Emission Efficiency for K-lines

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M. Procop

Microscopy and Microanalysis / Volume / Issue 04 / August 2004, pp 481 - 490

2004 Microscopy Society of America

DOI: http://dx.doi.org/10.1017/S1431927604040139 (About DOI), Published online: 01 August 2004

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Heterogeneity Evaluation of Research Materials for Microanalysis Standards Certification Heterogeneity Evaluation of Research Materials for Microanalysis Standards Certification

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Ryna Marinenko and Stefan Leigh

Microscopy and Microanalysis / Volume / Issue 04 / August 2004, pp 491 - 506

2004 Microscopy Society of America

DOI: http://dx.doi.org/10.1017/S1431927604040383 (About DOI), Published online: 01 August 2004

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Research Articles

Calendar of Meetings and Courses Calendar of Meetings and Courses

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Microscopy and Microanalysis / Volume / Issue 04 / August 2004, pp 507 - 510

2004 Microscopy Society of America

DOI: http://dx.doi.org/10.1017/S1431927604040966 (About DOI), Published online: 01 August 2004

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