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Table of Contents - December 2006 - Volume 21 , Issue 12
J.P. Winterstein and M.G. Norton
Copyright © Materials Research Society 2006
Published online: 03 March 2011
DOI: http://dx.doi.org/10.1557/jmr.2006.0368 (About DOI)
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Ju-Young Kim, Jung-Jun Lee, Yun-Hee Lee, Jae-il Jang and Dongil Kwon
DOI: http://dx.doi.org/10.1557/jmr.2006.0370 (About DOI)
John E. Klepeis
DOI: http://dx.doi.org/10.1557/jmr.2006.0371 (About DOI)
Yee-Wen Yen, Chien-Chung Jao and Chiapyng Lee
DOI: http://dx.doi.org/10.1557/jmr.2006.0369 (About DOI)
C.Y. Zhang, Y.W. Zhang, K.Y. Zeng, L. Shen and Y.Y. Wang
DOI: http://dx.doi.org/10.1557/jmr.2006.0395 (About DOI)
Theera Anukunprasert, Chintana Saiwan and Enrico Traversa
DOI: http://dx.doi.org/10.1557/jmr.2006.0373 (About DOI)
X. Yao
DOI: http://dx.doi.org/10.1557/jmr.2006.0374 (About DOI)
Yu-Long Jiang, Guo-Ping Ru, Xin-Ping Qu, Bing-Zong Li, Christophe Detavernier and R.L. Van Meirhaeghe
DOI: http://dx.doi.org/10.1557/jmr.2006.0375 (About DOI)
Haiying Xiao, Chundong Li, Dezhuang Yang, Shiyu He and Yanchun Tao
DOI: http://dx.doi.org/10.1017/S0884291400081966 (About DOI)
Catherine A. Tweedie and Krystyn J. Van Vliet
DOI: http://dx.doi.org/10.1557/jmr.2006.0377 (About DOI)
S. Gupta, O.A. Williams, R.J. Patel and K. Haenen
DOI: http://dx.doi.org/10.1557/jmr.2006.0372 (About DOI)
A. Vlad, A. Stierle, N. Kasper, H. Dosch and M. Rühle
DOI: http://dx.doi.org/10.1557/jmr.2006.0397 (About DOI)
Sara M.C. Vieira, Odile Stéphan and David L. Carroll
DOI: http://dx.doi.org/10.1557/jmr.2006.0392 (About DOI)
Sinn-wen Chen and Shih-kang Lin
DOI: http://dx.doi.org/10.1557/jmr.2006.0378 (About DOI)
F.J. Espinoza Beltrán, J. Muñoz-Saldaña, D. Torres-Torres, R. Torres-Martínez and G.A. Schneider
DOI: http://dx.doi.org/10.1557/jmr.2006.0379 (About DOI)
Wenru Zhao, Jianlin Shi, Hangrong Chen and Lingxia Zhang
DOI: http://dx.doi.org/10.1557/jmr.2006.0381 (About DOI)
Ching-Chang Ko, Michelle Oyen, Alison M. Fallgatter, Jin-Hong Kim, Jim Fricton and Wei-Shou Hu
DOI: http://dx.doi.org/10.1557/jmr.2006.0394 (About DOI)
David J. Scurr and Stephen J. Eichhorn
DOI: http://dx.doi.org/10.1557/jmr.2006.0382 (About DOI)
S. Gupta, R.J. Patel and R.E. Giedd
DOI: http://dx.doi.org/10.1557/jmr.2006.0380 (About DOI)
Fan-Yi Hsu, Ching-Chich Leu, Chao-Hsin Chien and Chen-Ti Hu
DOI: http://dx.doi.org/10.1557/jmr.2006.0383 (About DOI)
Manhong Zhao, Xi Chen, Nagahisa Ogasawara, Anghel Constantin Razvan, Norimasa Chiba, Dongyun Lee and Yong X. Gan
DOI: http://dx.doi.org/10.1557/jmr.2006.0384 (About DOI)
Masaharu Nakayama, Masaki Fukuda, Sayaka Konishi and Tsuyoshi Tonosaki
DOI: http://dx.doi.org/10.1557/jmr.2006.0385 (About DOI)
F. Iacopi, Y. Travaly, M. Van Hove, A.M. Jonas, J.M. Molina-Aldareguia, M.R. Elizalde and I. Ocaña
DOI: http://dx.doi.org/10.1557/jmr.2006.0386 (About DOI)
D.P. Adams, M.A. Rodriguez, C.P. Tigges and P.G. Kotula
DOI: http://dx.doi.org/10.1557/jmr.2006.0387 (About DOI)
Z.P. Lu, C.T. Liu and X.Z. Wang
DOI: http://dx.doi.org/10.1557/jmr.2006.0388 (About DOI)
Zhuoying Chen, Limin Huang, Jiaqing He, Yimei Zhu and Stephen O'Brien
DOI: http://dx.doi.org/10.1557/jmr.2006.0389 (About DOI)
Jeong-Won Yoon, Jun Hyung Lim, Hoo-Jeong Lee, Jinho Joo, Seung-Boo Jung and Won-Chul Moon
DOI: http://dx.doi.org/10.1557/jmr.2006.0390 (About DOI)
A. Conde-Gallardo, M. Guerrero, R. Fragoso and N. Castillo
DOI: http://dx.doi.org/10.1557/jmr.2006.0391 (About DOI)
Marko Hrovat, Thomas Maeder, Caroline Jacq, Janez Holc and Janez Bernard
DOI: http://dx.doi.org/10.1557/jmr.2006.0396 (About DOI)
Jin Hyoung Lee, Qi Wu and Wounjhang Park
DOI: http://dx.doi.org/10.1557/jmr.2006.0398 (About DOI)
Laurent Gremillard, Eduardo Saiz, Velimir R. Radmilovic and Antoni P. Tomsia
DOI: http://dx.doi.org/10.1557/jmr.2006.0393 (About DOI)
G. Yogeeswaran, C.R. Chenthamarakshan, N.R. de Tacconi and K. Rajeshwar
DOI: http://dx.doi.org/10.1557/jmr.2006.0399 (About DOI)
Weiqun Chen and Alexandra Navrotsky
DOI: http://dx.doi.org/10.1557/jmr.2006.0400 (About DOI)
DOI: http://dx.doi.org/10.1017/S0884291400082212 (About DOI)
DOI: http://dx.doi.org/10.1017/S0884291400081875 (About DOI)