Microscopy and Microanalysis Vol. 8 Issue 04

Microscopy and Microanalysis

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Table of Contents - Volume 8 - Issue 04 - 2002

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INTRODUCTION

Introduction: A Symposium Dedicated to Gareth Thomas on the Occasion of his 70^th Birthday Introduction: A Symposium Dedicated to Gareth Thomas on the Occasion of his 70^th Birthday

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D.G. Howitt

Microscopy and Microanalysis / Volume 8 / Issue 04 / August 2002, pp 237 - 240

2002 Microscopy Society of America

DOI: http://dx.doi.org/10.1017.S1431927602029963 (About DOI), Published online: 09 January 2003

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A SYMPOSIUM IN HONOR OF PROFESSOR GARETH THOMAS

Ordering Energies and Occupancies in Doped TiAl, and Dedicated ALCHEMI Instrumentation Ordering Energies and Occupancies in Doped TiAl, and Dedicated ALCHEMI Instrumentation

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J.C.H. Spence, N. Jiang and U. Weierstall

Microscopy and Microanalysis / Volume 8 / Issue 04 / August 2002, pp 241 - 246

2002 Microscopy Society of America

DOI: http://dx.doi.org/10.1017.S1431927602020172 (About DOI), Published online: 09 January 2003

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Electron Microscopy Observations on the Role of Twinning in the Evolution of Microstructures Electron Microscopy Observations on the Role of Twinning in the Evolution of Microstructures

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U. Dahmen, C.J.D. Hetherington, V. Radmilovic, E. Johnson, S.Q. Xiao and C.P. Luo

Microscopy and Microanalysis / Volume 8 / Issue 04 / August 2002, pp 247 - 256

2002 Microscopy Society of America

DOI: http://dx.doi.org/10.1017.S1431927602020184 (About DOI), Published online: 09 January 2003

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Dewetting of Liquids on Ceramic Surfaces at High Temperatures Dewetting of Liquids on Ceramic Surfaces at High Temperatures

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N. Ravishankar, Shelley R. Gilliss and C. Barry Carter

Microscopy and Microanalysis / Volume 8 / Issue 04 / August 2002, pp 257 - 267

2002 Microscopy Society of America

DOI: http://dx.doi.org/10.1017.S1431927602020196 (About DOI), Published online: 09 January 2003

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Structural Evolution in Amorphous Silicon and Germanium Thin Films Structural Evolution in Amorphous Silicon and Germanium Thin Films

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L.J. Chen, S.L. Cheng, C.H. Yu, P.Y. Su, H.H. Lin and K.S. Chi

Microscopy and Microanalysis / Volume 8 / Issue 04 / August 2002, pp 268 - 273

2002 Microscopy Society of America

DOI: http://dx.doi.org/10.1017.S1431927602020202 (About DOI), Published online: 09 January 2003

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Ultrasoft Magnetic Films Investigated with Lorentz Tranmission Electron Microscopy and Electron Holography Ultrasoft Magnetic Films Investigated with Lorentz Tranmission Electron Microscopy and Electron Holography

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Jeff Th.M. De Hosson, Nicolai G. Chechenin, Daan-Hein Alsem, Tomas Vystavel, Bart J. Kooi, Antoni R. Chezan and Dik O. Boerma

Microscopy and Microanalysis / Volume 8 / Issue 04 / August 2002, pp 274 - 287

2002 Microscopy Society of America

DOI: http://dx.doi.org/10.1017.S1431927602020214 (About DOI), Published online: 09 January 2003

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In Situ TEM Studies of Metal–Carbon Reactions In Situ TEM Studies of Metal–Carbon Reactions

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Robert Sinclair, Toshio Itoh and Richard Chin

Microscopy and Microanalysis / Volume 8 / Issue 04 / August 2002, pp 288 - 304

2002 Microscopy Society of America

DOI: http://dx.doi.org/10.1017.S1431927602020226 (About DOI), Published online: 09 January 2003

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Early Stages of Carbon Segregation and Precipitation in a [Sigma] = 5 (310)[001] Molybdenum Tilt Boundary Early Stages of Carbon Segregation and Precipitation in a [Sigma] = 5 (310)[001] Molybdenum Tilt Boundary

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Jean-Michel Pénisson and Maria Bacia

Microscopy and Microanalysis / Volume 8 / Issue 04 / August 2002, pp 305 - 311

2002 Microscopy Society of America

DOI: http://dx.doi.org/10.1017.S1431927602020238 (About DOI), Published online: 09 January 2003

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Nanometric Scale Investigation of Local Strain in GaInAs Islands by High Resolution and Analytical TEM Nanometric Scale Investigation of Local Strain in GaInAs Islands by High Resolution and Analytical TEM

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J.Y. Laval, S. Kret, C. Delamarre, P. Bassoul, T. Benabbas and Y. Androussi

Microscopy and Microanalysis / Volume 8 / Issue 04 / August 2002, pp 312 - 318

2002 Microscopy Society of America

DOI: http://dx.doi.org/10.1017.S1431927602020251 (About DOI), Published online: 09 January 2003

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Physical and Magnetic Modification of Co/Pt Multilayers by Ion Irradiation Physical and Magnetic Modification of Co/Pt Multilayers by Ion Irradiation

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G.J. Kusinski and G. Thomas

Microscopy and Microanalysis / Volume 8 / Issue 04 / August 2002, pp 319 - 332

2002 Microscopy Society of America

DOI: http://dx.doi.org/10.1017.S1431927602020275 (About DOI), Published online: 09 January 2003

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Nanoscale Phenomena in Synthetic Functional Oxide Heterostructures Nanoscale Phenomena in Synthetic Functional Oxide Heterostructures

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V. Nagarajan, C.S. Ganpule, A. Stanishevsky, B.T. Liu and R. Ramesh

Microscopy and Microanalysis / Volume 8 / Issue 04 / August 2002, pp 333 - 349

2002 Microscopy Society of America

DOI: http://dx.doi.org/10.1017.S1431927602020287 (About DOI), Published online: 09 January 2003

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Use of Plasmon Spectroscopy to Evaluate the Mechanical Properties of Materials at the Nanoscale Use of Plasmon Spectroscopy to Evaluate the Mechanical Properties of Materials at the Nanoscale

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Vladimir P. Oleshko, Mitsuhiro Murayama and James M. Howe

Microscopy and Microanalysis / Volume 8 / Issue 04 / August 2002, pp 350 - 364

2002 Microscopy Society of America

DOI: http://dx.doi.org/10.1017.S1431927602020299 (About DOI), Published online: 09 January 2003

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BOOK REVIEW

Electron Microscopy, Second Edition, John J. Bozzola and Lonnie D. Russell. Jones and Bartlett Publishers, Inc., Sudbury, MA, 1999, 670 pages (hardback, $56.25). ISBN 0-7637-0192-0 Electron Microscopy, Second Edition, John J. Bozzola and Lonnie D. Russell. Jones and Bartlett Publishers, Inc., Sudbury, MA, 1999, 670 pages (hardback, \$56.25). ISBN 0-7637-0192-0

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Bob Price

Microscopy and Microanalysis / Volume 8 / Issue 04 / August 2002, pp 365 - 366

DOI: http://dx.doi.org/10.1017/S1431927602029975 (About DOI), Published online: 09 January 2003

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