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Table of Contents - March 2006 - Volume 21 , Issue 03
Sandeep Kumar, Ralf Thomann and Thomas Nann
Copyright © Materials Research Society 2006
Published online: 03 March 2011
DOI: http://dx.doi.org/10.1557/jmr.2006.0068 (About DOI)
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Rosalía Poyato, Bryan D. Huey and Nitin P. Padture
DOI: http://dx.doi.org/10.1557/jmr.2006.0069 (About DOI)
Andrei Rar, G.M. Pharr, W.C. Oliver, E. Karapetian and Sergei V. Kalinin
DOI: http://dx.doi.org/10.1557/jmr.2006.0081 (About DOI)
J.E. Huber
DOI: http://dx.doi.org/10.1557/jmr.2006.0082 (About DOI)
John A. Moriarty, Lorin X. Benedict, James N. Glosli, Randolph Q. Hood, Daniel A. Orlikowski, Mehul V. Patel, Per Söderlind, Frederick H. Streitz, Meijie Tang and Lin H. Yang
DOI: http://dx.doi.org/10.1557/jmr.2006.0070 (About DOI)
Zakhary F. Krasilnik, Boris A. Andreev, Denis I. Kryzhkov, Ludmila V. Krasilnikova, Viktor P. Kuznetsov, Dmitry Yu. Remizov, Viacheslav B. Shmagin, Margarita V. Stepikhova, Artem N. Yablonskiy, Tom Gregorkievicz, Nguyen Q. Vinh, Wolfgang Jantsch, Hanka Przybylinska, Victor Yu. Timoshenko and Denis M. Zhigunov
DOI: http://dx.doi.org/10.1557/jmr.2006.0083 (About DOI)
Jun-ichi Tani, Guerman Popov, Paul R. Mort and Richard E. Riman
DOI: http://dx.doi.org/10.1557/jmr.2006.0071 (About DOI)
S. Venkataraman, S. Scudino, J. Eckert, T. Gemming, C. Mickel, L. Schultz and D.J. Sordelet
DOI: http://dx.doi.org/10.1557/jmr.2006.0072 (About DOI)
Zaoli Zhang, Thomas Wagner, Wilfried Sigle and Andreas Schulz
DOI: http://dx.doi.org/10.1557/jmr.2006.0073 (About DOI)
Ling-Ling Shi, Han Ma, Teng Liu, Jian Xu and En Ma
DOI: http://dx.doi.org/10.1557/jmr.2006.0074 (About DOI)
S. Tripathi, R. Brajpuriya, C. Mukharjee and S.M. Chaudhari
DOI: http://dx.doi.org/10.1557/jmr.2006.0096 (About DOI)
Haixia Shang, Tanguy Rouxel, Marc Buckley and Cedric Bernard
DOI: http://dx.doi.org/10.1557/jmr.2006.0097 (About DOI)
K. Mondal, U.K. Chatterjee and B.S. Murty
DOI: http://dx.doi.org/10.1557/jmr.2006.0084 (About DOI)
J.X. Zhang, H. Harada and Y. Koizumi
DOI: http://dx.doi.org/10.1557/jmr.2006.0085 (About DOI)
Zhicheng Liu, Hangrong Chen, Weiming Huang, Jinlou Gu, Wenbo Bu, Zile Hua and Jianlin Shi
DOI: http://dx.doi.org/10.1557/jmr.2006.0075 (About DOI)
E. Tyulyukovskiy and N. Huber
DOI: http://dx.doi.org/10.1557/jmr.2006.0076 (About DOI)
D. Klötzer, Ch. Ullner, E. Tyulyukovskiy and N. Huber
DOI: http://dx.doi.org/10.1557/jmr.2006.0077 (About DOI)
Lili Zhao, Martin Steinhart, Jian Yu and Ulrich Gösele
DOI: http://dx.doi.org/10.1557/jmr.2006.0078 (About DOI)
Y.D. Wang, D.Y. Cong, R. Lin Peng, P. Zetterström, Z.F. Zhang, X. Zhao and L. Zuo
DOI: http://dx.doi.org/10.1557/jmr.2006.0079 (About DOI)
Jae-Woong Nah, Fei Ren, Kyung-Wook Paik and K.N. Tu
DOI: http://dx.doi.org/10.1557/jmr.2006.0086 (About DOI)
Satoshi Tanaka, Atsushi Makiya, Zenji Kato, Nozomu Uchida, Tsunehisa Kimura and Keizo Uematsu
DOI: http://dx.doi.org/10.1557/jmr.2006.0098 (About DOI)
Naoki Fujisawa and Michael V. Swain
DOI: http://dx.doi.org/10.1557/jmr.2006.0087 (About DOI)
Xi Chen, Yong Xiang and Joost J. Vlassak
DOI: http://dx.doi.org/10.1557/jmr.2006.0088 (About DOI)
Christopher A. Schuh, Corinne E. Packard and Alan C. Lund
DOI: http://dx.doi.org/10.1557/jmr.2006.0080 (About DOI)
Y.J. Tang, Q.M. Wang, F.H. Yuan, J. Gong and C. Sun
DOI: http://dx.doi.org/10.1557/jmr.2006.0089 (About DOI)
Gunchoo Shim, Je-Shin Park and Sung-Wook Cho
DOI: http://dx.doi.org/10.1557/jmr.2006.0093 (About DOI)
Yasumasa Chino, Tetsuji Hoshika, Jae-Seol Lee and Mamoru Mabuchi
DOI: http://dx.doi.org/10.1557/jmr.2006.0090 (About DOI)
Maruf Hossain, Harry M. Meyer, Husam H. Abu-Safe, Hameed Naseem and W.D. Brown
DOI: http://dx.doi.org/10.1557/jmr.2006.0091 (About DOI)
M.S. Bhuiyan, M. Paranthaman, A. Goyal, L. Heatherly and D.B. Beach
DOI: http://dx.doi.org/10.1557/jmr.2006.0099 (About DOI)
Souvik Math, V. Jayaram and S.K. Biswas
DOI: http://dx.doi.org/10.1557/jmr.2006.0094 (About DOI)
S. Math, V. Jayaram and S.K. Biswas
DOI: http://dx.doi.org/10.1557/jmr.2006.0095 (About DOI)
Tobias A. Schaedler, Ashutosh S. Gandhi, Mitsuhiro Saito, Manfred Rühle, Richard Gambino and Carlos G. Levi
DOI: http://dx.doi.org/10.1557/jmr.2006.0092 (About DOI)
Li-Lan Yang, Yi-Sheng Lai, J.S. Chen, P.H. Tsai, C.L. Chen and C. Jason Chang
DOI: http://dx.doi.org/10.1557/jmr.2006.0393e (About DOI)
DOI: http://dx.doi.org/10.1017/S0884291400080857 (About DOI)