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Table of Contents - 01 May 2000 - Volume 15 , Issue 05
N. Q. Chinh, F. Csikor, Zs. Kovács and J. Lendvai
Copyright © Materials Research Society 2000
Published online: 31 January 2011
DOI: http://dx.doi.org/10.1557/JMR.2000.0147 (About DOI)
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R. Jimeénez, A. Gonzaález, M. L. Calzada and J. Mendiola
DOI: http://dx.doi.org/10.1557/JMR.2000.0148 (About DOI)
Zhenhua Zhou, Jianhua Zhao, Wenkui Wang and Liling Sun
DOI: http://dx.doi.org/10.1557/JMR.2000.0149 (About DOI)
Yingjiu Zhang, Nanlin Wang, Rongrui He, Qi Zhang, Jing Zhu and Yunjie Yan
DOI: http://dx.doi.org/10.1557/JMR.2000.0150 (About DOI)
Neeta Toprani, Shane A. Catledge, Yogesh K. Vohra and Raymond Thompson
DOI: http://dx.doi.org/10.1557/JMR.2000.0151 (About DOI)
Yizhou Zhou, Rongshan Qin, Suhong Xiao, Guanhu He and Benlian Zhou
DOI: http://dx.doi.org/10.1557/JMR.2000.0152 (About DOI)
W. Brückner, V. Weihnacht, W. Pitschke, J. Thomas and S. Baunack
DOI: http://dx.doi.org/10.1557/JMR.2000.0153 (About DOI)
O. Martínez, J. Jiménez, D. Chambonnet and C. Belouet
DOI: http://dx.doi.org/10.1557/JMR.2000.0154 (About DOI)
H. K. Barik, S. K. Ghorai, S. Bhattacharya, D. Kilian and B. K. Chaudhuri
DOI: http://dx.doi.org/10.1557/JMR.2000.0155 (About DOI)
Richard J. McNeely, John A. Belot, Tobin J. Marks, Yanguo Wang, Vinayak P. Dravid, Michael P. Chudzik and Carl R. Kannewurf
DOI: http://dx.doi.org/10.1557/JMR.2000.0156 (About DOI)
F. Maglia, U. Anselmi-Tamburini, N. Bertolino, C. Milanese and Z. A. Munir
DOI: http://dx.doi.org/10.1557/JMR.2000.0157 (About DOI)
T. G. Holesinger, S. R. Foltyn, P. N. Arendt, H. Kung, Q. X. Jia, R. M. Dickerson, P. C. Dowden, R. F. DePaula, J. R. Groves and J. Y. Coulter
DOI: http://dx.doi.org/10.1557/JMR.2000.0158 (About DOI)
F. Caccavale, C. Sada, F. Segato, L. D. Bogomolova, N. A. Krasil'nikova, Yu. N. Korkishko, V. A. Fedorov and T. V. Morozova
DOI: http://dx.doi.org/10.1557/JMR.2000.0159 (About DOI)
Shen Zhu, C-H. Su, S. L. Lehoczky, M. A. George and D. H. Lowndes
DOI: http://dx.doi.org/10.1557/JMR.2000.0160 (About DOI)
N. Nagendra and V. Jayaram
DOI: http://dx.doi.org/10.1557/JMR.2000.0161 (About DOI)
DOI: http://dx.doi.org/10.1557/JMR.2000.0162 (About DOI)
Zhibin Wu, Tetsuji Tsukada and Masahiro Yoshimura
DOI: http://dx.doi.org/10.1557/JMR.2000.0163 (About DOI)
Peter Majewski, Lars Epple, Michael Rozumek, Heike Schluckwerder and Fritz Aldinger
DOI: http://dx.doi.org/10.1557/JMR.2000.0164 (About DOI)
J. L. MacManus-Driscoll, G. T. Tan, W. Y. Hung, A. V. Berenov, J. A. Alonso, M. G. Blamire, J. E. Evetts, F. Damay and L. F. Cohen
DOI: http://dx.doi.org/10.1557/JMR.2000.0165 (About DOI)
F. M. Pontes, E. B. Araujo, E. R. Leite, J. A. Eiras, E. Longo, J. A. Varela and M. A. Pereira-da-Silva
DOI: http://dx.doi.org/10.1557/JMR.2000.0166 (About DOI)
Faiz Dahmani, Ansgar W. Schmid, John C. Lambropoulos, Stephen J. Burns and Semyon Papernov
DOI: http://dx.doi.org/10.1557/JMR.2000.0167 (About DOI)
Masayuki Nogami, Tomotaka Ishikawa, Tomokatsu Hayakawa and Tomokatsu Hayakawa
DOI: http://dx.doi.org/10.1557/JMR.2000.0168 (About DOI)
J. L. Loubet, W. C. Oliver and B. N. Lucas
DOI: http://dx.doi.org/10.1557/JMR.2000.0169 (About DOI)
Joseph T. Mang, Cary B. Skidmore, Rex P. Hjelm and Philip M. Howe
DOI: http://dx.doi.org/10.1557/JMR.2000.0170 (About DOI)
J. Malzbender, G. de With and J. den Toonder
DOI: http://dx.doi.org/10.1557/JMR.2000.0171 (About DOI)
K. Nishimura, Y. A. Kim, T. Matushita, T. Hayashi, M. Endo and M. S. Dresselhaus
DOI: http://dx.doi.org/10.1557/JMR.2000.0172 (About DOI)