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Table of Contents - November 1996 - Volume 11 , Issue 11
M. Jain and T. Christman
Copyright © Materials Research Society 1996
Published online: 31 January 2011
DOI: http://dx.doi.org/10.1557/JMR.1996.0336 (About DOI)
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Jeong Soo Lee, Hyun Ja Kwon, Young Woo Jeong, Hyun Ha Kim and Cha Yeon Kim
DOI: http://dx.doi.org/10.1557/JMR.1996.0337 (About DOI)
Dongjian Li, Aiming Wang, Bing Yao, Bingzhe Ding and Zhuangqi Hu
DOI: http://dx.doi.org/10.1557/JMR.1996.0338 (About DOI)
X. Q. Zhao, Y. Liang, Z. Q. Hu and B. X. Liu
DOI: http://dx.doi.org/10.1557/JMR.1996.0339 (About DOI)
Y. Kanamori and Y. Shiohara
DOI: http://dx.doi.org/10.1557/JMR.1996.0340 (About DOI)
Yasuyuki Mizushima and Izumi Hirabayashi
DOI: http://dx.doi.org/10.1557/JMR.1996.0341 (About DOI)
J. Wang, I. Monot and G. Desgardin
DOI: http://dx.doi.org/10.1557/JMR.1996.0342 (About DOI)
X. Yao, M. Sumida and Y. Shiohara
DOI: http://dx.doi.org/10.1557/JMR.1996.0343 (About DOI)
J. Y. Huang, Y. D. Yu, Y. K. Wu, H. Q. Ye and Z. F. Dong
DOI: http://dx.doi.org/10.1557/JMR.1996.0344 (About DOI)
Eric M. Taleff, Mamoru Nagao, Yoshio Ashida and Oleg D. Sherby
DOI: http://dx.doi.org/10.1557/JMR.1996.0345 (About DOI)
A. Uoya, T. Shibata, K. Higashi, A. Inoue and T. Masumoto
DOI: http://dx.doi.org/10.1557/JMR.1996.0346 (About DOI)
X. Sun, S. Schneider, U. Geyer, W. L. Johnson and M-A. Nicolet
DOI: http://dx.doi.org/10.1557/JMR.1996.0347 (About DOI)
Koji Kobashi, Shigeaki Miyauchi, Koichi Miyata, Kozo Nishimura and Jorge J. Rocca
DOI: http://dx.doi.org/10.1557/JMR.1996.0348 (About DOI)
Wei Zhao, Jinke Tang, Ashok Puri, Ray L. Sweany, Yuxin Li and Liquan Chen
DOI: http://dx.doi.org/10.1557/JMR.1996.0349 (About DOI)
K. J. Hubbard and D. G. Schlom
DOI: http://dx.doi.org/10.1557/JMR.1996.0350 (About DOI)
S. Takeno, S. Nakamura, K. Abe and S. Komatsu
DOI: http://dx.doi.org/10.1557/JMR.1996.0351 (About DOI)
Ken'ichi Ota and Giuseppe Pezzotti
DOI: http://dx.doi.org/10.1557/JMR.1996.0352 (About DOI)
B. S. B. Karunaratne, R. J. Lumby and M. H. Lewis
DOI: http://dx.doi.org/10.1557/JMR.1996.0353 (About DOI)
S. W. Paulik, M. H. Zimmerman, K. T. Faber and E. R. Fuller
DOI: http://dx.doi.org/10.1557/JMR.1996.0354 (About DOI)
Jong-Heon Lee, W. Jack Lackey and James F. Benzel
DOI: http://dx.doi.org/10.1557/JMR.1996.0355 (About DOI)
Takamasa Ishigaki, Yusuke Moriyoshi, Takayuki Watanabe and Atsushi Kanzawa
DOI: http://dx.doi.org/10.1557/JMR.1996.0356 (About DOI)
David van Heerden, Emil Zolotoyabko and Dan Shechtman
DOI: http://dx.doi.org/10.1557/JMR.1996.0357 (About DOI)
Robert H. Doremus and Pratima Rao
DOI: http://dx.doi.org/10.1557/JMR.1996.0358 (About DOI)
H. W. Sheng, J. Xu, L. G. Yu, X. K. Sun, Z. Q. Hu and K. Lu
DOI: http://dx.doi.org/10.1557/JMR.1996.0359 (About DOI)
H. C. Barshilia, B. R. Mehta and V. D. Vankar
DOI: http://dx.doi.org/10.1557/JMR.1996.0360 (About DOI)
D. Majumdar, T. A. Shefelbine, T. T. Kodas and H. D. Glicksman
DOI: http://dx.doi.org/10.1557/JMR.1996.0361 (About DOI)
K. Byrappa and Amita Jain
DOI: http://dx.doi.org/10.1557/JMR.1996.0362 (About DOI)
J. H. Liang and K. Y. Liao
DOI: http://dx.doi.org/10.1557/JMR.1996.0363 (About DOI)
N. Claussen, D. E. Garcia and R. Janssen
DOI: http://dx.doi.org/10.1557/JMR.1996.0364 (About DOI)
F. A. Modine, A. R. Duggal, D. N. Robinson, E. L. Churnetski, M. Bartkowiak, G. D. Mahan and L. M. Levinson
DOI: http://dx.doi.org/10.1557/JMR.1996.0365 (About DOI)
Ming-Hung Lo and Wen-Cheng J. Wei
DOI: http://dx.doi.org/10.1557/JMR.1996.0366 (About DOI)
C. A. Melnick, Z. Chen and J. J. Mecholsky
DOI: http://dx.doi.org/10.1557/JMR.1996.0367 (About DOI)
Hiroshi Isobe, Ichiro Tokunaga, Noriyoshi Nagai and Katsumi Kaneko
DOI: http://dx.doi.org/10.1557/JMR.1996.0368 (About DOI)
Robert E. Apfel and Ning Qiu
DOI: http://dx.doi.org/10.1557/JMR.1996.0369 (About DOI)
Jun Liao and David C. Martin
DOI: http://dx.doi.org/10.1557/JMR.1996.0370 (About DOI)
Seok-Keun Koh, Won-Kook Choi, Jun-Sik Cho, Seok-Kyun Song, Young-Man Kim and Hyung-Jin Jung
DOI: http://dx.doi.org/10.1557/JMR.1996.0371 (About DOI)