The European Physical Journal - Applied Physics Vol. 3 Iss. 02

The European Physical Journal Applied Physics

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Table of Contents - August 1998 - Volume 3 - Issue 02

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Detection and characterization of stacking faults by light beam induced current mapping and scanning infrared microscopy in silicon Detection and characterization of stacking faults by light beam induced current mapping and scanning infrared microscopy in silicon

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C. Vève-Fossati and S. Martinuzzi

The European Physical Journal Applied Physics / Volume 3 / Issue 02 / 1998, pp 123 - 126

Published online by Cambridge University Press: 08 March 2011

DOI: http://dx.doi.org/10.1051/epjap:1998214 (About DOI)

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Relaxation phenomenon in composite materials Relaxation phenomenon in composite materials

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R. El. Moznine, F. Blanc, M. Lieutier and A. Lefort

The European Physical Journal Applied Physics / Volume 3 / Issue 02 / 1998, pp 127 - 134

Published online by Cambridge University Press: 08 March 2011

DOI: http://dx.doi.org/10.1051/epjap:1998212 (About DOI)

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De la nécessité d'une fine couche de nickel pour obtenir des couches minces de MoSe₂ photoconductrices De la nécessité d'une fine couche de nickel pour obtenir des couches minces de MoSe₂ photoconductrices

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J. Ouerfelli, Z. Jlaïel, N. Guettari, E. Gourmelon, J. Pouzet, J. C. Bernede, A. Khelil, M. Zoater and A. Conan

The European Physical Journal Applied Physics / Volume 3 / Issue 02 / 1998, pp 135 - 139

Published online by Cambridge University Press: 08 March 2011

DOI: http://dx.doi.org/10.1051/epjap:1998215 (About DOI)

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Couches minces supraconductrices à haute température critique pour l'électronique Couches minces supraconductrices à haute température critique pour l'électronique

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M. Guilloux-Viry and A. Perrin

The European Physical Journal Applied Physics / Volume 3 / Issue 02 / 1998, pp 141 - 147

Published online by Cambridge University Press: 08 March 2011

DOI: http://dx.doi.org/10.1051/epjap:1998216 (About DOI)

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Structural modifications induced by electronic energy loss in Ni₃B irradiated with GeV heavy ions Structural modifications induced by electronic energy loss in Ni₃B irradiated with GeV heavy ions

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A. Audouard, A. Dunlop, D. Lesueur, N. Lorenzelli and L. Thomé

The European Physical Journal Applied Physics / Volume 3 / Issue 02 / 1998, pp 149 - 158

Published online by Cambridge University Press: 08 March 2011

DOI: http://dx.doi.org/10.1051/epjap:1998217 (About DOI)

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Characterization and realization of a 120 kV, 200 ns transmission line pulse generator Characterization and realization of a 120 kV, 200 ns transmission line pulse generator

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M. Rivaletto and P. Pignolet

The European Physical Journal Applied Physics / Volume 3 / Issue 02 / 1998, pp 159 - 167

Published online by Cambridge University Press: 08 March 2011

DOI: http://dx.doi.org/10.1051/epjap:1998218 (About DOI)

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Printed circuit board (PCB) model using the thin-wire method to compute conducted EMI in power electronic systems Printed circuit board (PCB) model using the thin-wire method to compute conducted EMI in power electronic systems

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C. Labarre, Ph. Petit, F. Costa and C. Gautier

The European Physical Journal Applied Physics / Volume 3 / Issue 02 / 1998, pp 169 - 181

Published online by Cambridge University Press: 08 March 2011

DOI: http://dx.doi.org/10.1051/epjap:1998213 (About DOI)

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Diffraction peak shift in MgO small crystallites Diffraction peak shift in MgO small crystallites

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P. Gielen

The European Physical Journal Applied Physics / Volume 3 / Issue 02 / 1998, pp 183 - 186

Published online by Cambridge University Press: 08 March 2011

DOI: http://dx.doi.org/10.1051/epjap:1998219 (About DOI)

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Réponse d'un échantillon métallique à structure fractale à une excitation électrique à fréquence variable Réponse d'un échantillon métallique à structure fractale à une excitation électrique à fréquence variable

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T. Cisse Haba, G. Ablart and T. Camps

The European Physical Journal Applied Physics / Volume 3 / Issue 02 / 1998, pp 187 - 193

Published online by Cambridge University Press: 08 March 2011

DOI: http://dx.doi.org/10.1051/epjap:1998220 (About DOI)

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Vers une méthode de réglage expérimentale des commandes PID floues : application aux systèmes électromécaniques Vers une méthode de réglage expérimentale des commandes PID floues : application aux systèmes électromécaniques

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P. Maussion and D. Hissel

The European Physical Journal Applied Physics / Volume 3 / Issue 02 / 1998, pp 195 - 214

Published online by Cambridge University Press: 08 March 2011

DOI: http://dx.doi.org/10.1051/epjap:1998221 (About DOI)

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Experimental study of the transmission of breakdown plasma generated during laser shock processing Experimental study of the transmission of breakdown plasma generated during laser shock processing

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L. Berthe, R. Fabbro, P. Peyre and E. Bartnicki

The European Physical Journal Applied Physics / Volume 3 / Issue 02 / 1998, pp 215 - 218

Published online by Cambridge University Press: 08 March 2011

DOI: http://dx.doi.org/10.1051/epjap:1998222 (About DOI)

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The investigation of DC electrical discharges by the laser-gas interaction The investigation of DC electrical discharges by the laser-gas interaction

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N. Soulem and B. Held

The European Physical Journal Applied Physics / Volume 3 / Issue 02 / 1998, pp 219 - 232

Published online by Cambridge University Press: 08 March 2011

DOI: http://dx.doi.org/10.1051/epjap:1998223 (About DOI)

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