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Toward 3D Mapping of Octahedral Rotations at Perovskite Thin Film Heterointerfaces Unit Cell by Unit Cell

Published online by Cambridge University Press:  27 August 2014

Qian He
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
Ryo Ishikawa
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
Andrew R. Lupini
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
Qiao Liang
Affiliation:
The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
Michael D. Biegalski
Affiliation:
The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
Albina Borisevich
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Rondinelli, J. M., and Fennie, C. J. Advanced Materials 24 (2012).Google Scholar
[2] Johnson-Wilke, R. L., et al., Physical Review B 88 (2013).Google Scholar
[3] Kirkland, A. I. & Sloan, J., and Haigh, S. Ultramicroscopy 107 (2007).Google Scholar
[4] Kim, Y. M., et al., Adv Mater 25 (2013).Google Scholar
[5] Okunishi, E. & Sawada, H., and Kondo, Y. Micron 43 (2012).Google Scholar
[6] Levin, I., and Reaney, I. M. Adv Funct Mater 22 (2012).Google Scholar
[7] Woodward, D. I., and Reaney, I. M. Acta Crystallogr B 61 (2005).Google Scholar
[8] Hwang, J., et al., Physical Review B 87 (2013).Google Scholar
[9] Kirkland, E. J. Advanced Computing in Electron Microscopy (Springer, New York (2010), 2 edn.Google Scholar
[10] Findlay, S. D., et al., Ultramicroscopy 110 (2010).Google Scholar
[11] Research supported by the Materials Science and Engineering Division, U.S. Department of Energy (DOE), through a user project supported by ORNL’s Center for Nanophase Materials Sciences, sponsored by the Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. DOE. R.I. acknowledges support from JSPS Postdoctoral Fellowship for Research Abroad.Google Scholar