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Combined SIMS-SPM Instrument For High Sensitivity And High Resolution Elemental 3D Analysis

Published online by Cambridge University Press:  23 November 2012

T. Wirtz ,
Y. Fleming ,
U. Gysin ,
T. Glatzel ,
E. Meyer ,
U. Maier  and
U. Wegmann
T. Wirtz
Affiliation:
Science and Analysis of Materials (SAM), Centre de Recherche Public - Gabriel Lippmann, Belvaux, Luxembourg
Y. Fleming
Affiliation:
Science and Analysis of Materials (SAM), Centre de Recherche Public - Gabriel Lippmann, Belvaux, Luxembourg
U. Gysin
Affiliation:
University of Basel, Basel, Switzerland
T. Glatzel
Affiliation:
University of Basel, Basel, Switzerland
E. Meyer
Affiliation:
University of Basel, Basel, Switzerland
U. Maier
Affiliation:
Ferrovac GmbH, Zürich, Switzerland
U. Wegmann
Affiliation:
Ferrovac GmbH, Zürich, Switzerland
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 888 - 889
Copyright
Copyright © Microscopy Society of America 2012

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