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Abnormal spalling phenomena in the Sn-0.7Cu/Au/Ni/SUS304 interfacial reactions

Published online by Cambridge University Press:  31 January 2011

Shih-kang Lin
Affiliation:
Department of Materials Science and Engineering, National Taiwan University of Science and Technology, Taipei 106, Taiwan, Republic of China
Kuen-da Chen
Affiliation:
Graduate Institute of Engineering, National Taiwan University of Science and Technology, Taipei 106, Taiwan, Republic of China
Hao Chen
Affiliation:
Graduate Institute of Engineering, National Taiwan University of Science and Technology, Taipei 106, Taiwan, Republic of China
Wei-kai Liou
Affiliation:
Department of Chemical and Materials Engineering, Lunghwa University of Science and Technology, Taoyuan County 33306, Taiwan, Republic of China
Yee-wen Yen*
Affiliation:
Department of Materials Science and Engineering, National Taiwan University of Science and Technology, Taipei 106, Taiwan, Republic of China; and Graduate Institute of Engineering, National Taiwan University of Science and Technology, Taipei 106, Taiwan, Republic of China
*
b)Address all correspondence to this author. e-mail: ywyen@mail.ntust.edu.tw
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Abstract

The interfacial reactions in Sn-0.7wt%Cu/ENIG SUS304 couples at 240, 255, and 270 °C are examined in this study. The Ni-containing ternary Cu6Sn5 phase is formed at the Ni/liquid interface in the early reaction stage then it detaches massively from the SUS304 substrate and splits into two layers in the molten solder as the reaction time increases. This phase finally disintegrates and disappears. The square pillar-shaped FeSn2 phase is found on top of the SUS304 substrate when the Cu6Sn5 layer detaches. The reaction phase formation, detachment, and split mechanisms are proposed. The spalling phenomenon is reviewed and discussed. The growth mechanism of the FeSn2 phase obeys the parabolic law, and the activation energy is determined to be 112.5 KJ/mol.

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Articles
Copyright
Copyright © Materials Research Society 2010

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Footnotes

a)

Present address: Department of Materials Science and Engineering, University of Wisconsin−Madison, Madison, WI 53706.

References

REFERENCES

1.Wassink, R.J. Klein: Soldering in Electronics 2nd ed (Electrochemical Publications, Port Erin Isle of Man 1989)Google Scholar
2.Suganuma, K.: Advances in lead-free electronics soldering. Curr. Opin. Solid State Mater. Sci. 5, (1)55 (2001)CrossRefGoogle Scholar
3.Chen, S.W., Wang, C.H., Lin, S.K., Chiu, C.N.: Phase diagrams of Pb-free solders and their related materials systems. J. Mater. Sci.—Mater. Electron. 18, (1-3)19 (2007)CrossRefGoogle Scholar
4.Directive 2002/95/EC of the European Parliament and of the Council of 27 January 2003 on the Restriction of the Use of Certain Hazardous Substances in Electrical and Electronic Equipment. Official Journal of the European Union 13.2, L37/19 (2003)Google Scholar
5.Abtew, M., Selvaduray, G.: Lead-free solders in microelectronics. Mater. Sci. Eng., R 27, 95 (2000)CrossRefGoogle Scholar
6.Laurila, T., Vuorinen, V., Kivilahti, J.K.: Interfacial reactions between lead-free solders and common base materials. Mater. Sci. Eng., R 49, 1 (2005)CrossRefGoogle Scholar
7.Glazer, J.: Metallurgy of low temperature Pb-free solders for electronic assembly. Int. Mater. Rev. 40, (2)65 (1995)CrossRefGoogle Scholar
8.Chen, S.W., Wang, C.H., Lin, S.K., Chiu, C.N., Chen, C.C.: Phase transformation and micro-structural evolution in solder joints. JOM 59, (1)39 (2007)CrossRefGoogle Scholar
9.Lead-free assembly projects NEMI (National Electronics Manufacturing Initiatives). Available from http://www.nemi.org/projects/ese/lf_assembly.html (1999)Google Scholar
10.Kim, K.S., Huh, S.H., Suganuma, K.: Effects of intermetallic compounds on properties of lead-free soldered joints. J. Alloys Compd. 352, 226 (2003)CrossRefGoogle Scholar
11.Ho, C.E., Yang, S.C., Kao, C.R.: Interfacial reaction issues for lead-free electronic solders. J. Mater. Sci.—Mater. Electron. 18, 155 (2007)CrossRefGoogle Scholar
12.Yen, Y.W., Lee, C.Y., Kuo, M.H., Chao, K.S., Chen, K.D.: Interfacial reactions between lead-free solders and the multilayer Au/Ni/SUS304SS substrate. Int. J. Mater. Res. 100, (5)672 (2009)CrossRefGoogle Scholar
13.Lin, S.K., Chen, S.W.: Interfacial reactions in the Sn-20at.%In/Cu and Sn-20at.%In/Ni couples at 160 °C. J. Mater. Res. 21, (7)1712 (2006)CrossRefGoogle Scholar
14.Chen, S.W., Lin, S.K.: Effects of temperature on interfacial reactions in γ-InSn4/Ni couples. J. Mater. Res. 21, (5)1161 (2006)CrossRefGoogle Scholar
15.Oberndorff, P.: Lead-free solder systems: Phase relations and microstructures. Doctoral Dissertation Technical University of Eindhoven, Eindhoven The Netherlands (2001)Google Scholar
16.Lin, C.H., Chen, S.W., Wang, C.H.: Phase equilibria and solidification properties of Sn-Cu-Ni alloys. J. Electron. Mater. 31, (9)907 (2002)CrossRefGoogle Scholar
17.Li, C.Y., Duh, J.G.: Phase equilibria in the Sn-rich corner of the Sn-Cu-Ni ternary alloy system at 240 °C. J. Mater. Res. 20, 3118 (2005)CrossRefGoogle Scholar
18.Snugovsky, L., Snugovsky, P., Perovic, D.D., Rutter, J.W.: Phase equilibria in Sn rich corner of Cu-Ni-Sn system. Mater. Sci. Technol. 22, (8)899 (2006)CrossRefGoogle Scholar
19.Ho, C.H., Lin, Y.W., Yang, S.C., Kao, C.R., Jiang, D.S.: Effects of limited Cu supply on soldering reactions between SnAgCu and Ni. J. Electron. Mater. 35, (5)1017 (2006)CrossRefGoogle Scholar
20.Yang, S.C., Ho, C.E., Chang, C.W., Kao, C.R.: Massive spalling of intermetallic compounds in solder-substrate reactions due to limited supply of the active element. J. Appl. Phys. 101, 844911 (2007)CrossRefGoogle Scholar
21.Wang, C.H., Chen, S.W.: Sn-0.7 wt%Cu/Ni interfacial reactions at 250 °C. Acta Mater. 54, 247 (2006)CrossRefGoogle Scholar
22.Snugovsky, L., Snugovsky, P., Perovic, D.D., Rutter, J.W.: “Spalling” of SAC Pb free solders when used with nickel substrates. Mater. Sci. Technol. 25, (10)1296 (2009)CrossRefGoogle Scholar
23.Kim, H.K., Tu, K.N., Totta, P.A.: Ripening-assisted asymmetric spalling of Cu-Sn compound spheroids in solder joints on Si wafers. Appl. Phys. Lett. 68, (16)2204 (1996)CrossRefGoogle Scholar
24.Liu, C.Y., Kim, H.K., Tu, K.N.: Dewetting of molten Sn on Au/Cu/Cr thin-film metallization. Appl. Phys. Lett. 69, (26)4014 (1996)CrossRefGoogle Scholar
25.Liu, A.A., Kim, H.K., Tu, K.N.: Spalling of Cu6Sn5 spheroids in the soldering reaction of eutectic SnPb on Cr/Cu/Au thin films. J. Appl. Phys. 80, (5)2774 (1996)CrossRefGoogle Scholar
26.Pan, G.Z., Liu, A.A., Kim, H.K., Tu, K.N.: Microstructures of phased-in Cr-Cu/Cu Au bump-limiting metallization and its soldering behavior with high Pb content and eutectic PbSn Solders. Appl. Phys. Lett. 71, (20)2946 (1997)CrossRefGoogle Scholar
27.Jang, G.Y., Duh, J.G.: The effect of intermetallic compound morphology on Cu diffusion in Sn-Ag and Sn-Pb solder bump on the Ni/Cu under-bump metallization. J. Electron. Mater. 34, (1)677 (2005)CrossRefGoogle Scholar
28.Binary Alloy Phase Diagrams 2nd ed edited by H. Okamoto, P.R. Subramanian, and L. Kacprzak (ASM International, Materials Park, OH 1991)1774 Google Scholar
29.Ishida, K.: The reaction of solid iron with molten tin. Mater. Trans., JIM 14, 37 (1973)CrossRefGoogle Scholar
30.Hwang, C.W., Suganuma, K.: Interface microstructure between Fe-42Ni alloy and pure Sn. J. Mater. Res. 18, (5)1202 (2008)CrossRefGoogle Scholar
31.Huang, Y.C., Chen, S.W., Gierlotka, W., Chang, C.H., Wu, J.C.: Dissolution and interfacial reactions of Fe in molten Sn-Cu and Sn-Pb solders. J. Mater. Res. 22, (10)2924 (2007)CrossRefGoogle Scholar
32.Sarafianos, N.: Determining reaction time at iron/tin interface of electrolytic tinplate during first stage of FeSn2 growth. Mater. Sci. Technol. 3, 66 (1987)CrossRefGoogle Scholar
33.Sueyoshi, H., Odo, H., Mizokuchi, S., Abe, S., Saikusa, K.: Consumption of soldering iron by Pb-free solder. Mater. Trans. 47, (4)1221 (2006)CrossRefGoogle Scholar
34.van Beek, J.A., Stolk, S.A., van Loo, F.J.J.: Multiphase diffusion in the systems Fe-Sn and Ni-Sn. Z. Metallkd. 73, (7)439 (1982)Google Scholar