Hostname: page-component-76fb5796d-x4r87 Total loading time: 0 Render date: 2024-04-26T13:52:59.712Z Has data issue: false hasContentIssue false

Effect of geometry and interfacial resistance on current distribution and energy dissipation at metal/superconductor junctions

Published online by Cambridge University Press:  31 January 2011

Meilin Liu
Affiliation:
Department of Materials Science and Mineral Engineering, University of California, and Center for Advanced Materials, Materials and Chemical Sciences Division, Lawrence Berkeley Laboratory, I Cyclotron Road, Berkeley, California 94720
Lutgard C. De Jonghe
Affiliation:
Department of Materials Science and Mineral Engineering, University of California, and Center for Advanced Materials, Materials and Chemical Sciences Division, Lawrence Berkeley Laboratory, I Cyclotron Road, Berkeley, California 94720
Get access

Abstract

Potential and current distributions and local energy dissipation due to Joule heating in metal-superconductor junctions have been computed as a function of geometric parameters and interfacial resistance. The primary current distribution and power dissipation are highly nonuniform in the system. The secondary current distribution and power dissipation, however, become more uniform as the interfacial resistance increases. Analysis indicates that zero contact resistance is not a stable situation since the primary distribution leads to local current densities exceeding the critical current density of the superconducting phase near the corner of the junction. Local contact failure might then initiate. A finite contact resistance is necessary for a practical application, and the minimum value of the contact resistance can be estimated from the operating current density (javg) of the device and the critical current density (jcri) of the superconducting phase. To obtain an optimum value of the contact resistance, however, one further has to take into consideration the stability and reliability of the device performance, which is, in turn, directly related to the uniformity of the current distribution and power dissipation, to temperature fluctuation of the superconducting phases brought about by local power dissipation, and to the thermal management of the system. Furthermore, a nonuniform contact resistance layer of appropriate profile can redistribute the current more effectively and more uniformly and hence reduce the total power dissipation in the system for a given jmax/javg ratio obtained by a uniform resistance layer.

Type
Articles
Copyright
Copyright © Materials Research Society 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1Moulton, H. F.Proc. of the London Mathematical Society, Ser. 2, 3, 104 (1905).CrossRefGoogle Scholar
2Tobias, C. W.Numerical Evaluation of Current Distribution in Electrode Systems” (Abs. No. 323) in C.I.T.C.E. (International Committee for Electrochemical Thermodynamics and Kinetics) 13th meeting, Rome, September 24-29, 1962.Google Scholar
3Fleck, R. N. “Numerical Evaluation of Current Distribution in Electrochemical Systems” (M.S. Thesis), University of California, Berkeley, CA, September 1964 (URCL-11612).CrossRefGoogle Scholar
4Newman, J.S.Electrochemical Systems (Prentice-Hall, Englewood Cliffs, NJ, 1972).Google Scholar
5Tobias, C. W. and Wijsman, R.J. Electrochem. Soc. 100, 459 (1953).CrossRefGoogle Scholar
6Newman, J.S.J,. Electrochem. Soc. 113, 1235 (1966).CrossRefGoogle Scholar
7Richardson, T. and Jonghe, L. C. De, “Aluminum Cladding of High Tc Superconductor by Thermocompression Bonding”, LBL #25499, July 1988.Google Scholar
8Ekin, J. W.Larson, T. M.Bergren, N. F.Nelson, A. J.Swartziander, A. B.Kazmerski, L. L.Panson, A.J. and Blankenship, B.A.Appl. Phys. Lett. 52, 1819 (1988).CrossRefGoogle Scholar
9Tzeng, Y.J. Electrochem. Soc. 135, 1309 (1988).CrossRefGoogle Scholar
10Duzer, T. Van and Turner, C. W.Principles of Superconductive Devices and Circuits (Elsevier, New York, 1981).Google Scholar
11Schrieffer, J.R.Theory of Superconductivity (W. A. Benjamin New York, 1964).Google Scholar