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Structural Quality of GaSb/GaAs Quantum Dots for Solar Cells Analyzed by Electron Microscopy Techniques

Published online by Cambridge University Press:  14 March 2016

N. Fernández-Delgado
Affiliation:
Department of Material Science, Metallurgical Engineering and Inorganic Chemistry, University of Cádiz, 11510, Puerto Real, Cádiz, Spain.
M. Herrera
Affiliation:
Department of Material Science, Metallurgical Engineering and Inorganic Chemistry, University of Cádiz, 11510, Puerto Real, Cádiz, Spain.
N. Baladés
Affiliation:
Department of Material Science, Metallurgical Engineering and Inorganic Chemistry, University of Cádiz, 11510, Puerto Real, Cádiz, Spain.
J. S. James
Affiliation:
Physics Department, Lancaster University, Lancaster, LA1 4YB, UK.
A. Krier
Affiliation:
Physics Department, Lancaster University, Lancaster, LA1 4YB, UK.
H. Fujita
Affiliation:
Magnetic Sensors Process Technology & Development Department, Asahi-Kasei Microdevices, Japan.
S. I. Molina
Affiliation:
Department of Material Science, Metallurgical Engineering and Inorganic Chemistry, University of Cádiz, 11510, Puerto Real, Cádiz, Spain.

Abstract

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Type
Material Sciences
Copyright
Copyright © Microscopy Society of America 2016 

References

[1]Nozik, A., Physica E 14 (2002). p. 115.Google Scholar
[2]Carrington, P. J., Wagener, M. C., Botha, J. R., Sanchez, A. M. & Krier, A., Appl. Phys. Lett 101 (2012) 231101.Google Scholar
[3]Carrington, P. J., Mahajumi, A. S., Wagener, M. C., Botha, J. R., Zhuang, Q. & Krier, A., Physica 407 (2012). p. 1493.Google Scholar
[4]Chou, S. K., Yang, W. M., Chua, K. J., Li, J. & Zhang, K. L., Applied Energy 91 (2012). p. 304.Google Scholar
[5]Tang, L., Ye, H. & Xu, J., Solar En. Mat. & Solar Cells 122 (2014). p. 94.Google Scholar
[6]Laghumavarapu, B., Moscho, A., Khoshakhlagh, A., El-Emawy, M., Lester, L. F. & Huffaker, D. L., Appl. Phys. Lett 90 (2007), 173125.Google Scholar
[7]Schaller, R. D. & Klimov, V.I., Phys. Rev. Lett 92 (2004) 186601.Google Scholar
[8]Lopatin, S., Pennycook, S. J., Narayan, J. & Duscher, G., Appl. Phys. Lett 81 (2002). p. 15.Google Scholar
[9]Rocher, A. M., Solid State Phenom 19/20 (1991). p. 363.Google Scholar
[10]Mancini, L., Fotana, Y., Conesa-Boj, S., Blum, I., Vurpillot, F., Francavigilia, L., Russo-Averchi, E., Heiss, M., Arbiol, J., Fontcuberta, M. I. & Rigutti, L., Appl. Phys. Lett 105 (2014) 4904952.Google Scholar