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Growth and transport properties of p-type GaNBi alloys

Published online by Cambridge University Press:  17 November 2011

Alejandro X. Levander ,
Sergei V. Novikov ,
Zuzanna Liliental-Weber ,
Roberto dos Reis ,
Jonathan D. Denlinger ,
Junqiao Wu ,
Oscar D. Dubon ,
C.T. Foxon ,
Kin M. Yu  and
Wladek Walukiewicz
Alejandro X. Levander
Affiliation:
Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720; and Department of Materials Science and Engineering, University of California, Berkeley, California 94720
Sergei V. Novikov
Affiliation:
School of Physics and Astronomy, University of Nottingham, Nottingham NG7 2RD, United Kingdom
Zuzanna Liliental-Weber
Affiliation:
Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720
Roberto dos Reis
Affiliation:
Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720; and Instituto de Física, UFRGS, Porto Alegre, RS 15051, 91501-970 Brazil
Jonathan D. Denlinger
Affiliation:
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720
Junqiao Wu
Affiliation:
Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720; and Department of Materials Science and Engineering, University of California, Berkeley, California 94720
Oscar D. Dubon
Affiliation:
Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720; and Department of Materials Science and Engineering, University of California, Berkeley, California 94720
C.T. Foxon
Affiliation:
School of Physics and Astronomy, University of Nottingham, Nottingham NG7 2RD, United Kingdom
Kin M. Yu
Affiliation:
Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720
Wladek Walukiewicz*
Affiliation:
Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720
*
a)Address all correspondence to this author. e-mail: W_Walukiewicz@lbl.gov
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Abstract

Thin films of GaNBi alloys with up to 12.5 at.% Bi were grown on sapphire using low-temperature molecular beam epitaxy. The low growth temperature and incorporation of Bi resulted in a morphology of nanocrystallites embedded in an amorphous matrix. The composition and optical absorption shift were found to depend strongly on the III:V ratio controlled by the Ga flux during growth. Increasing the incorporation of Bi resulted in an increase in conductivity of almost five orders of magnitude to 144 Ω-cm−1. Holes were determined to be the majority charge carriers indicating that the conductivity most likely results from a GaNBi-related phase. Soft x-ray emission and x-ray absorption spectroscopies were used to probe the modification of the nitrogen partial density of states due to Bi. The valence band edge was found to shift abruptly to the midgap position of GaN, whereas the conduction band edge shifted more gradually.

Keywords

SemiconductingNitrideBi
Type
Invited Feature Papers
Information
Journal of Materials Research , Volume 26 , Issue 23 , 14 December 2011 , pp. 2887 - 2894
Copyright
Copyright © Materials Research Society 2011

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