Hostname: page-component-76fb5796d-2lccl Total loading time: 0 Render date: 2024-04-25T14:33:45.059Z Has data issue: false hasContentIssue false
  • English
  • Français

Advanced Electron Microscopy for Energy Related Materials

Published online by Cambridge University Press:  23 September 2015

Ryo Ishikawa ,
Naoya Shibata  and
Yuichi Ikuhara
Ryo Ishikawa
Affiliation:
Institute of Engineering Innovation, University of Tokyo, Bunkyo, Tokyo, 113-8656, Japan.
Naoya Shibata
Affiliation:
Institute of Engineering Innovation, University of Tokyo, Bunkyo, Tokyo, 113-8656, Japan. Japan Science and Technology Agency, PRESTO, Saitama 332-0012, Japan
Yuichi Ikuhara
Affiliation:
Institute of Engineering Innovation, University of Tokyo, Bunkyo, Tokyo, 113-8656, Japan. WPI Research Center, AIMR, Tohoku University, Sendai 980-8577, Japan Nanostructures Research Laboratory, Japan Fine Ceramics Center, Atsuta, Nagoya 456-8587, Japan

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 471 - 472
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Findlay, SD, et al., Appl. Phys. Lett. 95 (2009) 191913.CrossRefGoogle Scholar
[2] Ishikawa, R, et al., Nature Mater. 10(2010), 278.CrossRefGoogle Scholar
[3] Yu, H, et al., Angew. Chem. Int. Ed. 52 (2013) 5969.CrossRefGoogle Scholar
[4] Matsukawa, M, et al., Nano Lett. 52 (2014) 5969.Google Scholar
[5] The authors acknowledge our collaborators of Dr. H. Yu, Prof. H.S. Zhou in AIST, and Mr. M. Matsukawa, Dr. T. Hisatomi, Dr. Y. Moriya and Prof. K. Domen in Univ. Tokyo. The work was supported by the Funding Program for World-Leading Innovation R&D on Science and Technology (FIRST Program)..Google Scholar