Hostname: page-component-76fb5796d-5g6vh Total loading time: 0 Render date: 2024-04-26T08:06:47.883Z Has data issue: false hasContentIssue false
  • English
  • Français

Strain Control at Two-Dimensional Oxide Interfaces Probed by Aberration-Corrected STEM-EELS

Published online by Cambridge University Press:  23 September 2015

David J. Baek ,
Di Lu ,
Yasuyuki Hikita ,
Harold Y. Hwang  and
Lena F. Kourkoutis
David J. Baek
Affiliation:
School of Electrical and Computer Engineering, Cornell University, Ithaca, NY, USA.
Di Lu
Affiliation:
Department of Applied Physics, Stanford University, Stanford, CA, USA.
Yasuyuki Hikita
Affiliation:
Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo P.ark, CA, USA.
Harold Y. Hwang
Affiliation:
Department of Applied Physics, Stanford University, Stanford, CA, USA. Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo P.ark, CA, USA.
Lena F. Kourkoutis
Affiliation:
Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, NY, USA.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1137 - 1138
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Lu, D, et al, MRS Spring (2014), K12.11.Google Scholar
[2] Chang, C. -P, et al, Nat. Commun. 5 (2014). p 1.Google Scholar
[3] Arredondo, M, et al, Adv. Mater. 22 (2010). p 2430.Google Scholar
[4] This work was supported by the Cornell Center for Materials Research with funding from the NSF MRSEC program (DMR-1120296) and the Department of Energy, Office of Basic Energy Sciences, Division of Materials Sciences and Engineering, under contract DE-AC02-76SF00515.Google Scholar