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Nye Tensor Dislocation Density Mapping From Precession Electron Diffraction: Effects of Filtering and Angular Resolution

Published online by Cambridge University Press:  23 September 2015

A.C. Leff
Affiliation:
Department of Materials Science and Engineering, Drexel University, Philadelphia, PA
C.R. Weinberger
Affiliation:
Department of Mechanical Engineering and Mechanics, Drexel University, Philadelphia, PA
M.L. Taheri
Affiliation:
Department of Materials Science and Engineering, Drexel University, Philadelphia, PA

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

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[4] Leff, A.C., Weinberger, C.R. & Taheri, M.L., Ultramicroscopy 153 (2015). p 9.CrossRefGoogle Scholar
[5] Rauch, E.F. & Veron, M., Mater. Charact. 98 (2014). p 1.Google Scholar
[6] Leff, A.C. & Taheri, M.L. are grateful for support from: US DOE Basic Energy Sciences Early Career program (DE-SC0008274); National Science Foundation Faculty Early Career Program (#1150807); and DOE Nuclear Energy University Program (NE0000315).Google Scholar