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Periodic Artifact Reduction in Fourier Transforms of Full Field Atomic Resolution Images

Published online by Cambridge University Press:  19 January 2015

Robert Hovden ,
Yi Jiang ,
Huolin L. Xin  and
Lena F. Kourkoutis
Robert Hovden*
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA
Yi Jiang
Affiliation:
Department of Physics, Cornell University, Ithaca, NY 14853, USA
Huolin L. Xin
Affiliation:
Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, NY 11973, USA
Lena F. Kourkoutis
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY 14853, USA
*
*Corresponding author. E-mail: rmh244@cornell.edu
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Abstract

The discrete Fourier transform is among the most routine tools used in high-resolution scanning/transmission electron microscopy (S/TEM). However, when calculating a Fourier transform, periodic boundary conditions are imposed and sharp discontinuities between the edges of an image cause a cross patterned artifact along the reciprocal space axes. This artifact can interfere with the analysis of reciprocal lattice peaks of an atomic resolution image. Here we demonstrate that the recently developed Periodic Plus Smooth Decomposition technique provides a simple, efficient method for reliable removal of artifacts caused by edge discontinuities. In this method, edge artifacts are reduced by subtracting a smooth background that solves Poisson’s equation with boundary conditions set by the image’s edges. Unlike the traditional windowed Fourier transforms, Periodic Plus Smooth Decomposition maintains sharp reciprocal lattice peaks from the image’s entire field of view.

Keywords

STEMFourier transformdata processingatomic imagingdiffractionaberration correction
Type
Materials Applications
Information
Microscopy and Microanalysis , Volume 21 , Issue 2 , April 2015 , pp. 436 - 441
Copyright
© Microscopy Society of America 2015 

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