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Total-Scattering Pair-Distribution Function of Organic Material from Powder Electron Diffraction Data

Published online by Cambridge University Press:  16 December 2014

Tatiana E. Gorelik ,
Martin U. Schmidt ,
Ute Kolb  and
Simon J. L. Billinge
Tatiana E. Gorelik*
Affiliation:
Institute of Physical Chemistry, Johannes Gutenberg-University, Jakob Welder Weg 11, 55128 MainzGermany
Martin U. Schmidt
Affiliation:
Institute of Inorganic and Analytical Chemistry, Goethe University, Max-von-Laue-Str. 7, D-60438 Frankfurt am Main, Germany
Ute Kolb
Affiliation:
Institute of Physical Chemistry, Johannes Gutenberg-University, Jakob Welder Weg 11, 55128 MainzGermany Institute of Applied Geosciences, Technical University Darmstadt, Schnittspahnstr. 9, 64287 Darmstadt, Germany
Simon J. L. Billinge
Affiliation:
Department of Applied Physics and Applied Mathematics, Columbia University, New York, NY 10027, USA Condensed Matter Physics and Materials Science Department, Brookhaven National Laboratory, Upton, NY 11973, USA
*
*Corresponding author. gorelik@uni-mainz.de; kolb@uni-mainz.de
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Abstract

This paper shows that pair-distribution function (PDF) analyses can be carried out on organic and organometallic compounds from powder electron diffraction data. Different experimental setups are demonstrated, including selected area electron diffraction and nanodiffraction in transmission electron microscopy or nanodiffraction in scanning transmission electron microscopy modes. The methods were demonstrated on organometallic complexes (chlorinated and unchlorinated copper phthalocyanine) and on purely organic compounds (quinacridone). The PDF curves from powder electron diffraction data, called ePDF, are in good agreement with PDF curves determined from X-ray powder data demonstrating that the problems of obtaining kinematical scattering data and avoiding beam damage of the sample are possible to resolve.

Keywords

pair-distribution functionelectron diffractiontotal scatteringnanocrystalline materials
Type
Materials Applications
Information
Microscopy and Microanalysis , Volume 21 , Issue 2 , April 2015 , pp. 459 - 471
Copyright
© Microscopy Society of America 2014 

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