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Atom Column Indexing: Atomic Resolution Image Analysis Through a Matrix Representation

Published online by Cambridge University Press:  17 November 2014

Xiahan Sang ,
Adedapo A. Oni  and
James M. LeBeau
Xiahan Sang
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695-7907, USA
Adedapo A. Oni
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695-7907, USA
James M. LeBeau*
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695-7907, USA
*
*Corresponding author. jmlebeau@ncsu.edu
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Abstract

Here, we report the development of an approach to map atomic resolution images into a convenient matrix representation. Through the combination of two-dimensional Gaussian fitting and the projective standard deviation, atom column locations are projected onto two noncollinear reference lattice vectors that are used to assign each a unique (i, j) matrix index. By doing so, straightforward atomic resolution image analysis becomes possible. Using practical examples, we demonstrate that the matrix representation greatly simplifies categorizing atom columns to different sublattices. This enables a myriad of direct analyses, such as mapping atom column properties and correlating long-range atom column pairs. MATLAB source code can be downloaded from https://github.com/subangstrom/aci.

Keywords

scanning transmission electron microscopy (STEM)projective standard deviationatom column fittingimage analysisatomic resolution
Type
Materials Applications
Information
Microscopy and Microanalysis , Volume 20 , Issue 6 , December 2014 , pp. 1764 - 1771
Copyright
© Microscopy Society of America 2014 

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