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Replica Extraction Method on Nanostructured Gold Coatings and Orientation Determination Combining SEM and TEM Techniques

Published online by Cambridge University Press:  14 October 2014

Christian Bocker Open the ORCID record for Christian Bocker [Opens in a new window] ,
Michael Kracker  and
Christian Rüssel
Christian Bocker*
Affiliation:
Otto-Schott-Institut, University Jena, Fraunhoferstr 6, 07743 Jena, Germany
Michael Kracker
Affiliation:
Otto-Schott-Institut, University Jena, Fraunhoferstr 6, 07743 Jena, Germany
Christian Rüssel
Affiliation:
Otto-Schott-Institut, University Jena, Fraunhoferstr 6, 07743 Jena, Germany
*
*Corresponding author.christian.bocker@uni-jena.de
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Abstract

In the field of electron microscopy the replica technique is known as an indirect method and also as an extraction method that is usually applied on metallurgical samples. This contribution describes a fast and simple transmission electron microscopic (TEM) sample preparation by complete removal of nanoparticles from a substrate surface that allows the study of growth mechanisms of nanostructured coatings. The comparison and combination of advanced diffraction techniques in the TEM and scanning electron microscopy (SEM) provide possibilities for operators with access to both facilities. The analysis of TEM-derived diffraction patterns (convergent beam electron diffraction) in the SEM/electron backscatter diffraction software simplifies the application, especially when the patterns are not aligned along a distinct zone axis. The study of the TEM sample directly by SEM and transmission Kikuchi diffraction allows cross-correlation with the TEM results.

Keywords

SEMTEMTKDnanoparticlereplica
Type
Technology and Software Development
Information
Microscopy and Microanalysis , Volume 20 , Issue 6 , December 2014 , pp. 1654 - 1661
Copyright
© Microscopy Society of America 2014 

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