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Optimal Sample Preparation to Characterize Corrosion in Historical Photographs with Analytical TEM

Published online by Cambridge University Press:  26 September 2014

Eva Grieten ,
Joost Caen  and
Dominique Schryvers
Eva Grieten*
Affiliation:
EMAT, Department of Physics, University of Antwerp, Groeneborgerlaan 171, 2020 Antwerp, Belgium Research Group Heritage & Sustainability, Faculty of Design Sciences, Conservation Studies, University of Antwerp, Blindestraat 9, 2000 Antwerp, Belgium
Joost Caen
Affiliation:
Research Group Heritage & Sustainability, Faculty of Design Sciences, Conservation Studies, University of Antwerp, Blindestraat 9, 2000 Antwerp, Belgium
Dominique Schryvers
Affiliation:
EMAT, Department of Physics, University of Antwerp, Groeneborgerlaan 171, 2020 Antwerp, Belgium
*
*Corresponding author. eva.grieten@uantwerpen.be
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Abstract

An alternative focused ion beam preparation method is used for sampling historical photographs containing metallic nanoparticles in a polymer matrix. We use the preparation steps of classical ultra-microtomy with an alternative final sectioning with a focused ion beam. Transmission electron microscopy techniques show that the lamella has a uniform thickness, which is an important factor for analytical transmission electron microscopy. Furthermore, the method maintains the spatial distribution of nanoparticles in the soft matrix. The results are compared with traditional preparation techniques such as ultra-microtomy and classical focused ion beam milling.

Keywords

sample preparationfocused ion beamultra-microtomyconservation of cultural heritagecomposite materialsnanoparticles
Type
Instrumentation and Techniques Development
Information
Microscopy and Microanalysis , Volume 20 , Issue 5 , October 2014 , pp. 1585 - 1590
Copyright
© Microscopy Society of America 2014 

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