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Correlation of X-Ray Dark-Field Radiography to Mechanical Sample Properties

Published online by Cambridge University Press:  01 July 2014

Andreas Malecki ,
Elena Eggl ,
Florian Schaff Open the ORCID record for Florian Schaff [Opens in a new window] ,
Guillaume Potdevin ,
Thomas Baum ,
Eduardo Grande Garcia ,
Jan S. Bauer  and
Franz Pfeiffer
Andreas Malecki
Affiliation:
Physik-Department, Technische Universität München, James-Franck-Str. 1, 85748 Garching, Germany IMETUM Zentralinstitut für Medizintechnik, Technische Universität München, Boltzmannstraß e 11, 85748 Garching, Germany
Elena Eggl
Affiliation:
Physik-Department, Technische Universität München, James-Franck-Str. 1, 85748 Garching, Germany IMETUM Zentralinstitut für Medizintechnik, Technische Universität München, Boltzmannstraß e 11, 85748 Garching, Germany
Florian Schaff*
Affiliation:
Physik-Department, Technische Universität München, James-Franck-Str. 1, 85748 Garching, Germany IMETUM Zentralinstitut für Medizintechnik, Technische Universität München, Boltzmannstraß e 11, 85748 Garching, Germany
Guillaume Potdevin
Affiliation:
Physik-Department, Technische Universität München, James-Franck-Str. 1, 85748 Garching, Germany IMETUM Zentralinstitut für Medizintechnik, Technische Universität München, Boltzmannstraß e 11, 85748 Garching, Germany
Thomas Baum
Affiliation:
Institut für Radiologie, Klinikum rechts der Isar, Technische Universität München, Ismaninger Straße 22, 81675 München, Bavaria, Germany
Eduardo Grande Garcia
Affiliation:
Institut für Radiologie, Klinikum rechts der Isar, Technische Universität München, Ismaninger Straße 22, 81675 München, Bavaria, Germany
Jan S. Bauer
Affiliation:
Abteilung für Neuroradiologie, Klinikum rechts der Isar, Technische Universität München, Ismaninger Straße 22, 81675 München, Bavaria, Germany
Franz Pfeiffer
Affiliation:
Physik-Department, Technische Universität München, James-Franck-Str. 1, 85748 Garching, Germany IMETUM Zentralinstitut für Medizintechnik, Technische Universität München, Boltzmannstraß e 11, 85748 Garching, Germany
*
*Corresponding author. florian.schaff@tum.de
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Abstract

The directional dark-field signal obtained with X-ray grating interferometry yields direction-dependent information about the X-ray scattering taking place inside the examined sample. It allows examination of its morphology without the requirement of resolving the micrometer size structures directly causing the scattering. The local morphology in turn gives rise to macroscopic mechanical properties of the investigated specimen. In this study, we investigate the relation between the biomechanical elasticity (Young’s modulus) and the measured directional dark-field parameters of a well-defined sample made of wood. In our proof-of-principle experiment, we found a correlation between Young’s modulus, the average dark-field signal, and the average dark-field anisotropy. Hence, we are able to show that directional dark-field imaging is a new method to predict mechanical sample properties. As grating interferometry provides absorption, phase-contrast, and dark-field data at the same time, this technique appears promising to combine imaging and mechanical testing in a single testing stage. Therefore, we believe that directional dark-field imaging will have a large impact in the materials science world.

Keywords

grating interferometrydirectional dark-field imagingmechanical testingYoung’s modulusaverage anisotropy
Type
Materials Applications
Information
Microscopy and Microanalysis , Volume 20 , Issue 5 , October 2014 , pp. 1528 - 1533
Copyright
© Microscopy Society of America 2014 

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