Hostname: page-component-6b989bf9dc-mbg9n Total loading time: 0 Render date: 2024-04-14T19:07:36.934Z Has data issue: false hasContentIssue false
  • English
  • Français

Atomic-scale Observation of Grains and Grain Boundaries in Monolayers of WS2

Published online by Cambridge University Press:  27 August 2014

Amin Azizi ,
Xiaolong Zou ,
Peter Ercuis ,
Zhuhua Zhang ,
Ana Laura Elias ,
Néstor Perea-López ,
Mauricio Terrones ,
Boris I. Yakobson  and
Nasim Alem
Amin Azizi
Affiliation:
Department of Materials Science and Engineering, Materials Research Institute, and Center for Two Dimensional and Layered Materials, The Pennsylvania State University, University Park, USA
Xiaolong Zou
Affiliation:
Department of Mechanical Engineering and Materials Science, Rice University, Houston, USA
Peter Ercuis
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, USA
Zhuhua Zhang
Affiliation:
Department of Mechanical Engineering and Materials Science, Rice University, Houston, USA
Ana Laura Elias
Affiliation:
Department of Physics, Department of Chemistry, and Center for Two Dimensional and Layered Materials, The Pennsylvania State University, University Park, USA
Néstor Perea-López
Affiliation:
Department of Physics, Department of Chemistry, and Center for Two Dimensional and Layered Materials, The Pennsylvania State University, University Park, USA
Mauricio Terrones
Affiliation:
Department of Materials Science and Engineering, Materials Research Institute, and Center for Two Dimensional and Layered Materials, The Pennsylvania State University, University Park, USA Department of Physics, Department of Chemistry, and Center for Two Dimensional and Layered Materials, The Pennsylvania State University, University Park, USA
Boris I. Yakobson
Affiliation:
Department of Mechanical Engineering and Materials Science, Rice University, Houston, USA
Nasim Alem
Affiliation:
Department of Materials Science and Engineering, Materials Research Institute, and Center for Two Dimensional and Layered Materials, The Pennsylvania State University, University Park, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1084 - 1085
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] van der Zande, A. M., Huang, P. Y., Chenet, D. a, Berkelbach, T. C., You, Y., Lee, G.-H., Heinz, T. F., Reichman, D. R., Muller, D. a & Hone, J. C. Nat. Mater. 12 (2013), P. 554.Google Scholar
[2] Gutiérrez, H. R., Perea-López, N., Elías, A. L., Berkdemir, A., Wang, B., Lv, R., López-Urías, F., Crespi, V. H., Terrones, H. & Terrones, M. Nano Lett. 13 (2013), P. 3447.Google Scholar
[3] Voiry, D., Yamaguchi, H., Li, J., Silva, R., Alves, D. C. B., Fujita, T., Chen, M., Asefa, T., Shenoy, V. B., Eda, G. & Chhowalla, M. Nat. Mater. 12 (2013), P. 850.Google Scholar
[4] Jaramillo, T. F., Jørgensen, K. P., Bonde, J., Nielsen, J. H., Horch, S. & Chorkendorff, I. Science 317 (2007), P. 100.Google Scholar
[5] Gibb, A. L., Alem, N., Chen, J., Erickson, K. J., Ciston, J., Gautam, A., Linck, M. & Zettl, A. J. Am. Chem. Soc. 135 (2013), P. 6758.Google Scholar
[6] Elías, A. L., Perea-López, N., Castro-Beltrán, A., Berkdemir, A., Lv, R., Feng, S., Long, A. D., Hayashi, T., Kim, Y. A., Endo, M., Gutiérrez, H. R., Pradhan, N. R., Balicas, L., Mallouk, T. E., López-Urías, F., Terrones, H., Terrones, M. & Nano, ACS 7 (2013), P. 5235.Google Scholar
[7] Zou, X., Liu, Y. & Yakobson, B. I. Nano Lett. 13 (2013), P. 253.Google Scholar