Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Inada, Hiromi
Hirayama, Yoichi
Tamura, Keiji
Terauchi, Daisuke
Namekawa, Ryoji
Shichiji, Takeharu
Sato, Takahiro
Suzuki, Yuya
Ohtsu, Yoshihiro
Watanabe, Keitaro
Konno, Mitsuru
Tanaka, Hiroyuki
Saito, Koichiro
Shimoyama, Wataru
Nakamura, Kuniyasu
Kaji, Kazutoshi
and
Hashimoto, Takahito
2015.
High Speed and Sensitive X-ray Analysis System with Automated Aberration Correction Scanning Transmission Electron Microscope.
Applied Microscopy,
Vol. 45,
Issue. 1,
p.
1.
Yeoh, Catriona S.M.
Rossouw, David
Saghi, Zineb
Burdet, Pierre
Leary, Rowan K.
and
Midgley, Paul A.
2015.
The Dark Side of EDX Tomography: Modeling Detector Shadowing to Aid 3D Elemental Signal Analysis.
Microscopy and Microanalysis,
Vol. 21,
Issue. 3,
p.
759.
Chen, Z.
D'Alfonso, A.J.
Weyland, M.
Taplin, D.J.
Allen, L.J.
and
Findlay, S.D.
2015.
Energy dispersive X-ray analysis on an absolute scale in scanning transmission electron microscopy.
Ultramicroscopy,
Vol. 157,
Issue. ,
p.
21.
Niekraszewicz, L.A.B.
de Souza, C.T.
Stori, E.M.
Jobim, P.F.C.
Amaral, L.
and
Dias, J.F.
2015.
The role of micro-NRA and micro-PIXE in carbon mapping of organic tissues.
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms,
Vol. 348,
Issue. ,
p.
160.
Zaluzec, Nestor J.
2015.
The influence of C/C correction in analytical imaging and spectroscopy in scanning and transmission electron microscopy.
Ultramicroscopy,
Vol. 151,
Issue. ,
p.
240.
Slater, Thomas J.A.
Janssen, Arne
Camargo, Pedro H.C.
Burke, M. Grace
Zaluzec, Nestor J.
and
Haigh, Sarah J.
2016.
STEM-EDX tomography of bimetallic nanoparticles: A methodological investigation.
Ultramicroscopy,
Vol. 162,
Issue. ,
p.
61.
Holm, Jason
and
Keller, Robert R.
2016.
Angularly-selective transmission imaging in a scanning electron microscope.
Ultramicroscopy,
Vol. 167,
Issue. ,
p.
43.
Procop, Mathias
Hodoroaba, Vasile-Dan
Terborg, Ralf
and
Berger, Dirk
2016.
Determination of the Effective Detector Area of an Energy-Dispersive X-Ray Spectrometer at the Scanning Electron Microscope Using Experimental and Theoretical X-Ray Emission Yields.
Microscopy and Microanalysis,
Vol. 22,
Issue. 6,
p.
1360.
Xing, Q.
2016.
Information or resolution: Which is required from an SEM to study bulk inorganic materials?.
Scanning,
Vol. 38,
Issue. 6,
p.
864.
MacArthur, Katherine E.
Slater, Thomas J. A.
Haigh, Sarah J.
Ozkaya, Dogan
Nellist, Peter D.
and
Lozano-Perez, Sergio
2016.
Quantitative Energy-Dispersive X-Ray Analysis of Catalyst Nanoparticles Using a Partial Cross Section Approach.
Microscopy and Microanalysis,
Vol. 22,
Issue. 1,
p.
71.
Lammer, Judith
Kraxner, Johanna
and
Grogger, Werner
2016.
European Microscopy Congress 2016: Proceedings.
p.
943.
Hayashida, Misa
and
Malac, Marek
2016.
Practical electron tomography guide: Recent progress and future opportunities.
Micron,
Vol. 91,
Issue. ,
p.
49.
Zaluzec, Nestor J.
2016.
Theoretical and Experimental X-Ray Peak/Background Ratios and Implications for Energy-Dispersive Spectrometry in the Next-Generation Analytical Electron Microscope.
Microscopy and Microanalysis,
Vol. 22,
Issue. 1,
p.
230.
Xu, W.
Dycus, J.H.
Sang, X.
and
LeBeau, J.M.
2016.
A numerical model for multiple detector energy dispersive X-ray spectroscopy in the transmission electron microscope.
Ultramicroscopy,
Vol. 164,
Issue. ,
p.
51.
Nylese, Tara
and
Rafaelsen, Jens
2017.
Improvements in SDD Efficiency – From X-ray Counts to Data.
Microscopy Today,
Vol. 25,
Issue. 2,
p.
46.
Augustyns, V.
Trekels, M.
Gunnlaugsson, H. P.
Masenda, H.
Temst, K.
Vantomme, A.
and
Pereira, L. M. C.
2017.
Multipurpose setup for low-temperature conversion electron Mössbauer spectroscopy.
Review of Scientific Instruments,
Vol. 88,
Issue. 5,
Sagar, J.
Statham, P.
Holland, J.
Pinard, P.
and
Lozano-Perez, S.
2017.
Progress in a New Method of Thickness Measurement by X-ray Analysis in TEM.
Microscopy and Microanalysis,
Vol. 23,
Issue. S1,
p.
30.
Chen, Z.
Taplin, D.J.
Weyland, M.
Allen, L.J.
and
Findlay, S.D.
2017.
Composition measurement in substitutionally disordered materials by atomic resolution energy dispersive X-ray spectroscopy in scanning transmission electron microscopy.
Ultramicroscopy,
Vol. 176,
Issue. ,
p.
52.
Koshiya, Shogo
and
Kimoto, Koji
2017.
Improvement of effective solid angle using virtual-pivot holder and large EDS detector.
Micron,
Vol. 93,
Issue. ,
p.
52.
Terborg, Ralf
Kaeppel, Andi
Yu, Baojun
Patzschke, Max
Salge, Tobias
and
Falke, Meiken
2017.
Advanced Chemical Analysis Using an Annular Four-Channel Silicon Drift Detector.
Microscopy Today,
Vol. 25,
Issue. 2,
p.
30.