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High-Resolution Spectroscopy of Bonding in a Novel BeP2N4 Compound

Published online by Cambridge University Press:  03 April 2014

Teresa Dennenwaldt
Affiliation:
Department of Chemistry and Center for NanoScience, Ludwig-Maximilians-Universität München, Butenandtstr. 5-13, 81377 Munich, Germany
Jim Ciston
Affiliation:
Lawrence Berkeley National Laboratory, National Center for Electron Microscopy, Berkeley, CA 94720, USA
Ulrich Dahmen
Affiliation:
Lawrence Berkeley National Laboratory, National Center for Electron Microscopy, Berkeley, CA 94720, USA
Wai-Yim Ching
Affiliation:
Department of Physics and Astronomy, University of Missouri–Kansas City, Kansas City, MO 64110, USA
Florian J. Pucher
Affiliation:
Department of Chemistry and Center for NanoScience, Ludwig-Maximilians-Universität München, Butenandtstr. 5-13, 81377 Munich, Germany
Wolfgang Schnick
Affiliation:
Department of Chemistry and Center for NanoScience, Ludwig-Maximilians-Universität München, Butenandtstr. 5-13, 81377 Munich, Germany
Christina Scheu*
Affiliation:
Department of Chemistry and Center for NanoScience, Ludwig-Maximilians-Universität München, Butenandtstr. 5-13, 81377 Munich, Germany
*
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Abstract

The recently discovered compound BeP2N4 that crystallizes in the phenakite-type structure has potential application as a high strength optoelectronic material. Therefore, it is important to analyze experimentally the electronic structure, which was done in the present work by monochromated electron energy-loss spectroscopy. The detection of Be is challenging due to its low atomic number and easy removal under electron bombardment. We were able to determine the bonding behavior and coordination of the individual atomic species including Be. This is evident from a good agreement between experimental electron energy-loss near-edge structures of the Be-K-, P-L2,3-, and N-K-edges and density functional theory calculations.

Type
EDGE Special Issue
Copyright
© Microscopy Society of America 2014 

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References

Armenta, M.G.M. & Reyes-Serrato, A. (2001). Direct wide band gap material: A Hartree-Fock study of α-Be3N2 . Comput Mater Sci 21, 95100.Google Scholar
Brydson, R. (2001). Electron Energy Loss Spectroscopy, 1st ed. Oxford: BIOS Scientific Publishers Limited.Google Scholar
Brydson, R., Bruley, J., Müllejans, H., Scheu, C. & Rühle, M. (1995). Modelling the bonding at metal-ceramic interfaces using PEELS in the STEM. Ultramicroscopy 59, 8192.Google Scholar
Ching, W.-Y. (1990). Theoretical studies of the electronic properties of ceramic materials. J Am Ceram Soc 73, 31353160.Google Scholar
Ching, W.-Y., Aryal, S., Rulis, P. & Schnick, W. (2011). Electronic structure and physical properties of the spinel-type phase of BeP2N4 from all-electron density functional calculations. Phys Rev B 83, 155109.Google Scholar
Ching, W.-Y. & Rulis, P. (2009). X-ray absorption near edge structure/electron energy loss near edge structure calculation using the supercell orthogonalized linear combination of atomic orbitals method. J Phys Condens Matter 21, 104202.Google Scholar
Ching, W.-Y. & Rulis, P. (2012). Electronic Structure Methods for Complex Materials: The Orthogonalized Linear Combination of Atomic Orbitals. Oxford: Oxford University Press.Google Scholar
Egerton, R.F. (2011). Electron Energy-Loss Spectroscopy in the Electron Microscope, 3rd ed. New York: Springer Science+Business Media.Google Scholar
Erni, R. & Browning, N.D. (2005). Valence electron energy-loss spectroscopy in monochromated scanning transmission electron microscopy. Ultramicroscopy 104, 176192.Google Scholar
Gu, L., Srot, V., Sigle, W., Koch, C.T., van Aken, P.A., Scholz, F., Thapa, S.B., Kirchner, C., Jetter, M. & Rühle, M. (2007). Band-gap measurements of direct and indirect semiconductors using monochromated electrons. Phys Rev B 75, 195214.Google Scholar
Haider, M., Müller, H., Uhlemann, S., Zach, J., Loebau, U. & Hoeschen, R. (2008). Prerequisites for a Cc/Cs-corrected ultrahigh-resolution TEM. Ultramicroscopy 108, 167178.Google Scholar
Horstmann, S., Irran, E. & Schnick, W. (1997). Synthesis and crystal structure of phosphorus(V) nitride α-P3N5 . Angew Chem Int Ed Engl 36, 18731875.Google Scholar
Kahl, F. & Rose, H. (2000). Design of a monochromator for electron sources. In 12th European Congress on Electron Microscopy, Brno, Tománek, P. & Kolarik R. (Eds.), pp. 1459–1460.Google Scholar
Kothleitner, G., Grogger, W. & Hofer, F. (2003). Experiencies and possibilities with a 200 kV monochromated (S)TEM. Microsc Microanal 9, 846847.Google Scholar
Kroll, P. & Schnick, W. (2002). A density functional study of phosphorus nitride P3 N5: Refined geometries, properties, and relative stability of α-P3N5 and γ-P3N5 and a further possible high-pressure phase δ-P3N5 with kyanite-type structure. Chem Eur J 8, 35303537.Google Scholar
Kuykendall, T., Ulrich, P., Aloni, S. & Yang, P. (2007). Complete composition tunability of InGaN nanowires using a combinatorial approach. Nat Mat 6, 951956.Google Scholar
De la Cruz, W., Soto, G. & Yubero, F. (2004). Beryllium nitride: An alternative material to beryllium for extreme ultraviolet and soft X-ray uses. Opt Mat 25, 3942.Google Scholar
Lambrecht, W.R.L. & Segall, B. (1992). Electronic structure of BeCN2: A proposed nearly direct wide-band-gap semiconductor. Phys Rev B 45, 14851487.Google Scholar
Lazar, P., Redinger, J., Strobl, J., Podloucky, R., Rashkova, B., Dehm, G., Kothleitner, G., Sturm, S., Kutschej, K., Mitterer, C. & Scheu, C. (2008). N-K electron energy-loss near-edge structures for TiN/VN layers: An ab initio and experimental study. Anal Bioanal Chem 390, 14471453.Google Scholar
Lazar, S., Botton, G.A., Wu, M.-Y., Tichelaar, F.D. & Zandbergen, H.W. (2003). Materials science applications of HREELS in near edge structure analysis and low-energy loss spectroscopy. Ultramicroscopy 96, 535546.Google Scholar
Lie, K., Hoier, R. & Brydson, R. (2000). Theoretical site- and symmetry-resolved density of states and experimental EELS near-edge spectra of AlB2 and TiB2 . Phys Rev B 61, 17861794.Google Scholar
Liebau, F. (1985). Structural Chemistry of Silicates. Berlin: Springer.Google Scholar
Mo, S.-D. & Ching, W.-Y. (2000). Ab initio calculation of the core-hole effect in the electron energy-loss near-edge structure. Phys Rev B 62, 79017907.Google Scholar
Mokhtari, A. & Akbarzadeh, H. (2003). Ab initio calculations of the electronic and structural properties of beryllium-, magnesium- and calcium-nitrides. Physica B Condens Matter 337, 122129.Google Scholar
Muller, D., Singh, D. & Silcox, J. (1998). Connections between the electron-energy-loss spectra, the local electronic structure, and the physical properties of a material: A study of nickel aluminum alloys. Phys Rev B 57, 81818202.Google Scholar
Nelhiebel, M., Louf, P.-H., Schattschneider, P., Blaha, P., Schwarz, K. & Jouffrey, B. (1999). Theory of orientation-sensitive near-edge fine-structure core-level spectroscopy. Phys Rev B 59, 807814.Google Scholar
Paxton, A.T., van Schilfgaarde, M., MacKenzie, M. & Craven, A.J. (2000). The near-edge structure in energy-loss spectroscopy: Many-electron and magnetic effects in transition metal nitrides and carbides. J Phys Condens Matter 12, 729750.Google Scholar
Pucher, F.J., Römer, S.R., Karau, F.W. & Schnick, W. (2010). Phenakite-type BeP2N4 – A possible precursor for a new hard spinel-type material. Chem Eur J 16, 72087214.Google Scholar
Schaffer, B., Grogger, W., Kothleitner, G. & Hofer, F. (2010). Comparison of EFTEM and STEM EELS plasmon imaging of gold nanoparticles in a monochromated TEM. Ultramicroscopy 110, 10871093.Google Scholar
Scheu, C., Dehm, G., Rühle, M. & Brydson, R. (1998). Electron-energy-loss spectroscopy studies of Cu-α-Al2O3 interfaces grown by molecular beam epitaxy. Philos Mag A 78, 439465.Google Scholar
Schnick, W., Lücke, J. & Krumeich, F. (1996). Phosphorus nitride P3N5: Synthesis, spectroscopic, and electron microscopic investigations. Chem Mater 8, 281286.Google Scholar
Tanaka, I. & Mizoguchi, T. (2009). First-principles calculations of X-ray absorption near edge structure and energy loss near edge structure: Present and future. J Phys Condens Matter 21, 104201.Google Scholar
Tsujimoto, M., Kurata, H., Nemoto, T., Isoda, S., Terada, S. & Kaji, K. (2005). Influence of nitrogen vacancies on the N K-ELNES spectrum of titanium nitride. J Electron Spectrosc Relat Phenomena 143, 159165.Google Scholar
Uhlemann, S. & Haider, M. (2002). Experimental set-up of a purely electrostatic monochromator for high resolution and analytical purposes of a 200 kV TEM. Microsc Microanal 8, 584585.Google Scholar
Zerr, A., Miehe, G., Serghiou, G., Schwarz, M., Kroke, E., Riedel, R., Fueß, H., Kroll, P. & Boehler, R. (1999). Synthesis of cubic silicon nitride. Nature 400, 340342.Google Scholar
Ziegler, A., Idrobo, J.C., Cinibulk, M.K., Kisielowski, C., Browning, N.D. & Ritchie, R.O. (2004). Interface structure and atomic bonding characteristics in silicon nitride ceramics. Science 306, 17681770.Google Scholar