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In-situ real-time x-ray scattering for probing the processing-structure-performance relation

Published online by Cambridge University Press:  11 June 2014

Detlef-M. Smilgies
Detlef-M. Smilgies*
Affiliation:
Cornell High Energy Synchrotron Source (CHESS) and School of Chemical and Biomolecular Engineering, Cornell University, Ithaca, NY 14853, USA
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Abstract

In-situ x-ray scattering methodology is discussed, in order to analyze the microstructure development of soft functional materials during coating, annealing, and drying processes in real-time. The relevance of a fundamental understanding of coating processes for future industrial production is pointed out.

Keywords

coatingelectronic materialsolution deposition
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1695: Symposium FF – The Grand Challenges in Organic Electronics , 2014 , mrss14-1695-ff07-03
Copyright
Copyright © Materials Research Society 2014 

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References

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