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Structural features and dopant gradients in Mg2SnXSi1-X ternary compounds

Published online by Cambridge University Press:  16 May 2014

E. Hatzikraniotis ,
G.S. Polymeris ,
C.B. Lioutas ,
A. Burkov ,
E-C. Stefanaki ,
A. Samunin ,
G. Isachenko ,
M.I. Fedorov  and
K.M. Paraskevopoulos
E. Hatzikraniotis
Affiliation:
Solid State Physics Section, Physics Department, Aristotle University of Thessaloniki, GR- 54124, Thessaloniki, Greece
G.S. Polymeris
Affiliation:
Solid State Physics Section, Physics Department, Aristotle University of Thessaloniki, GR- 54124, Thessaloniki, Greece
C.B. Lioutas
Affiliation:
Solid State Physics Section, Physics Department, Aristotle University of Thessaloniki, GR- 54124, Thessaloniki, Greece
A. Burkov
Affiliation:
IOFFE Physical and Technical Institute of the Russian Academy of Sciences, 194021 St Petersburg, Russia.
E-C. Stefanaki
Affiliation:
Solid State Physics Section, Physics Department, Aristotle University of Thessaloniki, GR- 54124, Thessaloniki, Greece
A. Samunin
Affiliation:
IOFFE Physical and Technical Institute of the Russian Academy of Sciences, 194021 St Petersburg, Russia.
G. Isachenko
Affiliation:
IOFFE Physical and Technical Institute of the Russian Academy of Sciences, 194021 St Petersburg, Russia.
M.I. Fedorov
Affiliation:
IOFFE Physical and Technical Institute of the Russian Academy of Sciences, 194021 St Petersburg, Russia.
K.M. Paraskevopoulos
Affiliation:
Solid State Physics Section, Physics Department, Aristotle University of Thessaloniki, GR- 54124, Thessaloniki, Greece
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Abstract

In the present work, a comparative study is attempted, dealing with the influence of the grain size distribution on the microstructure and the free carrier concentration in Mg2SnXSi1-X (x=0.2) ternary compounds doped with Sb. Structural in-homogeneities were monitored by using Transmission Electron Microscopy (TEM), Scanning Electron Microscopy (SEM) as well as Fourier transform infrared spectroscopy (FTIR) in the reflectivity mode.

Keywords

Snmorphologynanostructure
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1642: Symposium BB – Thermoelectric Materials—From Basic Science to Applications , 2014 , mrsf13-1642-bb03-09
Copyright
Copyright © Materials Research Society 2014 

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References

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